AFM/SPM Probes and Cantilevers for Measuring Electrical Properties of Nanomaterials
Introducing a conductive film coat probe suitable for measuring the electrical properties of various materials.
We would like to introduce our "AFM/SPM Probes and Cantilevers" for measuring the electrical properties of nanomaterials. For localized electrical property measurements, probes with metal film coatings are preferable. While platinum coating is the standard, you can also use platinum silicide or conductive diamond-coated types that enhance wear resistance during contact. 【Features】 ■ For measuring the electrical properties of nanomaterials ■ Probes with metal film coatings are suitable for localized electrical property measurements ■ Platinum silicide and conductive diamond-coated types are also available *For more details, please refer to the related link page or feel free to contact us.
Inquire About This Product
basic information
【Lineup】 ■NnaoWorld EFM ■NanoSensors PtSi Series ■NanoSensors CDT Series *For more details, please refer to the related link page or feel free to contact us.
Price range
P2
Delivery Time
P3
Applications/Examples of results
For more details, please refer to the related link page or feel free to contact us.
catalog（1）
Download All Catalogs
Company information
NanoAndMore Japan is a group company of NanoWorld, a global leading company based in Switzerland that specializes in probes for atomic force microscopy (AFM) and scanning probe microscopy (SPM). We offer a wide range of domestic inventory and provide high-quality products from specialized manufacturers of AFM/SPM probes.