Flexible design and manufacturing according to inspection conditions. Small lots are also acceptable. Comprehensive support from assembly, wiring, to inspection.
Our company designs and manufactures "contact probes, IC sockets, and probe cards" used for semiconductor testing. ☆Contact Probes☆ We can flexibly accommodate not only standard products but also special specifications tailored to testing conditions. ☆Probe Cards and IC Sockets☆ We can provide consistent processing and assembly of resin, allowing us to offer testing fixtures suitable for the inspection target at a low cost. 【Examples of Support】 ◎ Narrow pitch support (manufactured with MIN P=80μ) ◎ High current testing (manufactured for pre-process testing of IGBT devices) ◎ Non-magnetic testing (probes made from non-magnetic materials) ◎ Others: high frequency (10GHz), high heat resistance (below 300℃), etc. 【Product Examples】 <Contact Probes> - Reduces replacement hassle. "Rare metal probes" with excellent durability. - Revised internal structure. "New bias probes" for stable resistance value measurement. <IC Sockets> - Non-magnetic compatible sockets. - High heat resistant sockets. <Probe Cards> - Probe cards compatible with min 80μ pitch. - High current load test probe cards. *For more details, please refer to the materials. Feel free to contact us with any inquiries.*
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basic information
We are continuing to develop our technology, which we have cultivated over many years, to provide a more efficient inspection environment and to better meet your specific needs. *For more details, please refer to the materials. Feel free to contact us as well.*
Price information
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Delivery Time
Applications/Examples of results
【Contact Probe】 Electrical inspection device head Connector Substrate function inspection LCD panel lighting inspection Battery charge and discharge inspection 【Probe Card】 Semiconductor front-end inspection 【IC Socket】 Semiconductor back-end inspection *For more details, please refer to the PDF document or feel free to contact us.*
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![Semiconductor Inspection Equipment [IC Sockets and Probe Cards] Introduction Catalog](https://image.mono.ipros.com/public/catalog/image/01/ae1/438737/IPROS85003276613993070126.jpeg?w=120&h=170)
Company information
Our company is a manufacturer that has developed and designed inspection equipment essential for quality assurance. Since our founding in 1984, we have started manufacturing and selling various inspection jigs, specializing in probe pins and their application products. Since then, we have responded to customer needs in various markets, including semiconductor component inspection jigs such as probe cards and IC sockets, as well as liquid crystal panel inspection jigs. As a leading company in the industry, we have refined and honed our precision processing and assembly technology over many years. Keeping pace with the changing times, as a "TOTAL TEST SOLUTION" provider, we will continue to tackle the challenges in inspection operations with various products and services as a good partner for our customers. In recent years, we have also been providing the technology and know-how we have accumulated in producing our products to our customers through our EMS business. In addition to our unique skills, we also offer various support in manufacturing by matching our customers with partner companies and related firms. Seiken will always challenge itself, create new value, and pave the way for the future of manufacturing in Japan.
![Contact probe [tip shape suitable for application] 0.40mm (recommended)](https://image.mono.ipros.com/public/product/image/e87/2001407006/IPROS26693624223996519083.png?w=280&h=280)
![Contact probe [tip shape suitable for application] 0.80mm (recommended)](https://image.mono.ipros.com/public/product/image/82a/2001407035/IPROS22238524826182263279.png?w=280&h=280)
