High-power LD aging device "YC2000 Series"

Temperature control for each element is achieved through Peltier control! Stability of temperature control for each element is ensured.

The "YC2000 Series" is a high-output LD aging device capable of not only ACC and APC driving but also LIV measurement. Temperature control for each element is achieved using a Peltier control method, ensuring temperature control stability for each element. Since test conditions can be set for each unit, multiple levels of testing can be conducted in parallel. A series of characteristic tests such as long-term high-temperature operational life, temperature cycle operation, and temperature characteristics (step, gradient) will be measured with high resolution. 【Features】 ■ Reliability evaluation device for high-output laser diodes in red and blue ■ Ability to conduct tests in parallel at multiple levels ■ Capable of not only ACC and APC driving but also LIV measurement ■ Design support for test fixtures tailored to element shapes ■ A series of characteristic tests such as long-term high-temperature operational life, temperature cycle operation, and temperature characteristics (step, gradient) will be measured with high resolution *For more details, please refer to the PDF document or feel free to contact us.

Testing Equipment and Devices