ユアサエレクトロニクス Product Lineup

The "LDS-9000 Series" is an aging device that has the capability to continuously and accurately evaluate various shapes of LDs. It consists of a host computer, a constant temperature chamber, a control measurement terminal, and a drive driver. The measurement terminal is equipped with a computational processor for high-speed data measurement. Measurements can be driven from the host computer, allowing conditions such as drive, time, temperature, and measurement to be set at both the chamber unit and DUT board unit. 【Features】 ■ Measurement of the I-L, V, and Im characteristic curves of the device during testing is possible. ■ Automatic calibration function for optical output allows for automatic adjustment of optical output OFFSET and GAIN. ■ The photodetector for optical output measurement and the LD drive driver guarantee stable operation and high reliability. ■ In the event of a power outage or sudden power line interruption affecting the LD, slow down, slow up circuits, and protection circuits work to completely protect the LD. *For more details, please refer to the PDF document or feel free to contact us.

• Testing Equipment and Devices

The "YC2000 Series" is a high-output LD aging device capable of not only ACC and APC driving but also LIV measurement. Temperature control for each element is achieved using a Peltier control method, ensuring temperature control stability for each element. Since test conditions can be set for each unit, multiple levels of testing can be conducted in parallel. A series of characteristic tests such as long-term high-temperature operational life, temperature cycle operation, and temperature characteristics (step, gradient) will be measured with high resolution. 【Features】 ■ Reliability evaluation device for high-output laser diodes in red and blue ■ Ability to conduct tests in parallel at multiple levels ■ Capable of not only ACC and APC driving but also LIV measurement ■ Design support for test fixtures tailored to element shapes ■ A series of characteristic tests such as long-term high-temperature operational life, temperature cycle operation, and temperature characteristics (step, gradient) will be measured with high resolution *For more details, please refer to the PDF document or feel free to contact us.

• Testing Equipment and Devices

The "PL Mapping Device" is an apparatus for performing photoluminescence and film thickness mapping measurements on 2, 3, and 4-inch wafers for LED/LD production. With an automatic XY stage and original multifunctional measurement software, comprehensive mapping can be conducted. Additionally, by connecting to an automatic wafer supply and storage mechanism, full automation is possible. 【Features】 ■ Capable of measuring 2, 3, and 4-inch wafers ■ Measurement of 1/4 cut wafers is also possible with options ■ Comprehensive mapping ■ Full automation is possible *For more details, please download the PDF or feel free to contact us.

• Wafer
• Other measurement, recording and measuring instruments

The "Phosphor Wafer Mapping Device YB4" is a device that can perform high-speed, high-density mapping evaluation of phosphor materials using a transmitted light source. It can measure an area of 100×100mm or up to a maximum of 4 inches, and it also allows for optional switching to an LED light source (standard 447.5nm). Additionally, it is capable of measuring angular dependence (at a right angle of 45°) and transmittance. 【Features】 ■ Measurement of up to 4 inches is possible ■ Optional switching to LED light source available ■ Measurement of angular dependence is possible ■ Transmittance measurement is possible *For more details, please download the PDF or feel free to contact us.

• Wafer
• Other measurement, recording and measuring instruments