Probe for Scanning Probe Microscopy (SPM)

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last updated：Dec 18, 2020

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A lineup of various probes, including high-resolution models and cost-effective models. We also offer surface stress sensors.

As a member of the global probe manufacturer NanoWorld Group, we offer a variety of probes for Scanning Probe Microscopes (SPM). We have a rich lineup including high-end models that excel in fields requiring high resolution, as well as mid-range probes for Atomic Force Microscopes (AFM). We stock products domestically and provide them at short lead times and reasonable prices. 【Product Lineup (Partial)】 ■ NanoSensors PPP Series, NanoSensors ATEC Series High-end models that excel when high-resolution data is required ■ OPUS160AC Series, BudgetSensors Tap Series, etc. High cost performance for standard routine measurements ■ USC Series, OPUS 55AC Series, etc. Supports high-speed scanning with resonance frequencies in the MHz range, achieving several images per second In addition, we can propose solutions tailored to measurement needs such as electrical property measurements, long-duration measurements, measurements of soft materials, and nano-scale viscoelasticity measurements. *For more details, please refer to the materials. Feel free to contact us as well.

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【Other Products】 ■Akiyama Probe 　An AFM probe that combines a tuning fork-type quartz oscillator and a micro-cantilever. ■MSS Series Membrane-Type Surface Stress Sensor Chip 　A device that detects various trace components in the gas phase, such as gases and odors, with high sensitivity and converts them into electrical signals. ■AFM Accessories 　Calibration samples, various substrates, soundproof boxes, active vibration isolation tables, etc. *For more details, please refer to the materials. Feel free to contact us with any inquiries.