[Comprehensive Catalog] Probes and Cantilevers for SPM and AFM

Stock products domestically to achieve short delivery times! We also respond to inquiries regarding probe selection.

This is a cantilever that can be used with commercially available scanning probe microscopes and atomic force microscopes. Products from "NanoWorld," the world's largest probe manufacturing group, are used for various applications such as routine measurements in manufacturing process management, solid surface observation, material analysis, research on polymer materials, and biomaterials. We supply high-quality cantilevers with sharp tips and low variability in characteristics, as well as cantilevers equipped with probes suitable for industrial applications with high durability. [Contents] - Probes for AC mode non-contact mode - Probes for contact mode force-distance measurements - Broad compatibility for various measurement modes such as electrical and magnetic measurements - Colloid probes suitable for soft measurement targets like polymers and biomaterials - Self-exciting, self-detecting type - AFM accessories such as metal disks for fixing mica and HOPG samples *For more details, please refer to the PDF document or feel free to contact us.

Other measurement, recording and measuring instrumentsprobe