The Semilab PDL Hall effect measurement system is a standalone device that measures sheet resistance, carrier concentration, and mobility.
Hall effect measurement plays a very important role in the evaluation of electronic materials and electronic devices. However, in the measurement of low mobility materials, high resistance and thin film materials, or low resistance materials, the fact remains that small signals can be buried in noise, making evaluation difficult. By performing lock-in detection in an AC magnetic field, the PDL system (Parallel Dipole Line system) becomes an innovative magnetic trap system that realizes a unique camelback field confinement effect. Due to the diamagnetic levitation effect, diamagnetic materials such as graphite are trapped at the center. The Hall effect measurement system PDL-1000 can measure sheet resistance, carrier concentration, and mobility with wide range and high sensitivity in research and development applications. The PDL (Parallel Dipole Line) technology used in the PDL-1000 from Semilab is a patented technology developed by IBM.
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Features and System Specifications: Mobility High Sensitivity Measurement (Mobility Measurement Sensitivity < 0.1 cm²/Vs) Minor Carrier Separation Magnetic Field Dynamic Range (Approximately 2.5 T peak-to-peak) Uniformity (< 2% Sample Size up to 10×10 mm) User-Friendly Interface Proprietary Signal Processing Automatic Parameter Extraction Function Compact Table Size Design User-Friendly Operation Gate Bias Voltage Option No Cooling System Required
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To improve productivity in research and development environments, the PDL Hall Effect System is designed as a dedicated device for Hall effect measurements using AC and DC magnetic fields with permanent magnets, featuring user-friendly specifications for both hardware and software. The PDL Hall Effect Measurement System from Semilab enables highly sensitive measurements, making it suitable for testing semiconductor materials, compound semiconductors (III-V, II-VI), solar cell materials, transparent conductive oxides (TCOs), and organic materials (OTFT, OLED).
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Semilab is a comprehensive measurement device manufacturer that supports research and manufacturing of cutting-edge technologies worldwide. We handle non-contact CV measurement devices, lifetime measurement devices, spectroscopic ellipsometers, photoluminescence, DLTS systems, sheet resistance measurement devices, nanoindenters, AFM, and more for the inspection of semiconductor wafers and devices. Please feel free to contact us for specifications and pricing of our devices.
