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  6. Flying Probe Tester: APT-1400F-SL * Testing in progress

Flying Probe Tester: APT-1400F-SL * Testing in progress

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last updated:Apr 04, 2025

TAKAYA Corporation
TAKAYA Corporation
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It is a board inspection device capable of ultra-fast in-circuit testing at a top-class industry level. (Supported board size for inspection: up to 985×610)

The APT-1340J maintains its basic performance while expanding the compatible board size to W635×D610mm. Additionally, by adding an optional split inspection function, it can inspect long boards up to W985×D610mm. It can accommodate components with a height of 60mm and board weights of up to 10kg, making it suitable for inspecting boards used in automotive, aerospace, and medical devices, as well as power boards and probe cards, which are larger and heavier. ★You can bring your boards to our demo room at our Okayama headquarters for evaluation tests★ We can conduct a series of tests including creating inspection programs, inspecting actual boards, and summarizing evaluation results. If you are interested, please apply through the 'Contact Us' section below. *For product information, please download the PDF or feel free to contact us.*

    Circuit Board Inspection Equipment
1400F-SL_右斜め前_01.png

Flying Probe Tester: APT-1400F-SL * Testing in progress

1400F-SL_右斜め前_01.png
1400F-SL_右斜め前_01.png
  • Takaya Corporation Industrial Equipment Division Site
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basic information

To ensure that electronic devices function correctly, the electronic circuit board within the device must operate normally. The electronic circuit board becomes operational when electronic components are correctly mounted on the printed circuit board (PCB) and power is supplied. The process of contacting a dedicated probe to the electronic circuit board, which has electronic components mounted on it, and applying minute electrical signals for testing is called In-Circuit Testing (ICT), and the device used for this testing is referred to as an In-Circuit Tester. This testing checks the "connection reliability between electronic components and the board," the "values of individual mounted electronic components (such as resistors and capacitors)," and the "polarity of diodes," all without imposing unnecessary loads on the board itself. It is also known as MDA (Manufacturing Defect Analyzer). Main inspection contents: ● Solder shorts and opens ● Pattern disconnections ● Missing components ● Incorrect component values ● Reverse insertion of polarized components ● Lifted leads of ICs and connectors ● Operation verification of digital transistors, optocouplers, and Zener diodes ● Other simple function tests

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Applications/Examples of results

【Adopted Industries】  EMS, EMDS companies  Semiconductor manufacturing equipment  Communication infrastructure and servers  Automotive, aircraft, and marine  Medical devices  Industrial machinery and robots  FA machine tools  Power generation and power systems 【Use Cases】 ■ Inspection of mass-produced products  Connected to loaders/unloaders for automated/unmanned inspection even in large lots ■ Inspection of multi-variety small quantity substrates  No need for dedicated jig manufacturing costs; easy identification of defective areas ■ Inspection of prototype substrates  Function tests responsive to design changes (applying voltage to the substrate to confirm circuit operation (ON/OFF) and measure direct current) ■ Implementation confirmation inspection during model switching  Verification of the mounting program for the first lot and checking for setup errors during model changes ■ Defect analysis inspection  Inspection of substrates that failed functional tests and defect analysis of substrates that failed in the market We have a proven track record of use in various other applications as well. For more details, please contact your sales representative.

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Model number overview
APT-1400F-SL Large board compatible machine
APT-1400F-SL-A Large board compatible, inline machine (model with automatic transport conveyor)

catalog(16)

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Utilization of ODB++ format

Utilization of ODB++ format

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Collaboration between in-circuit testing and boundary scan testing.

Collaboration between in-circuit testing and boundary scan testing.

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Introduction to Flying Probe Testers

Introduction to Flying Probe Testers

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Accelerating Inspection of Flying Probe Testers Using Deep Reinforcement Learning [Ehime University Collaborative Research Material]

Accelerating Inspection of Flying Probe Testers Using Deep Reinforcement Learning [Ehime University Collaborative Research Material]

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Productronic Paper Interview Article

Productronic Paper Interview Article

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European electronics industry magazine "EPP" Takaya Flying Probe Tester feature article

European electronics industry magazine "EPP" Takaya Flying Probe Tester feature article

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Flying Probe Tester TAKAYA APT-1400F Series

Flying Probe Tester TAKAYA APT-1400F Series

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Latest Trends in BGA Implementation Board Inspection: Hybrid Testing of JTAG Boundary Scan and Flying Probe Testers

Latest Trends in BGA Implementation Board Inspection: Hybrid Testing of JTAG Boundary Scan and Flying Probe Testers

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Industrial Equipment Division Product Introduction

Industrial Equipment Division Product Introduction

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Latest Trends in Hybrid Testing Systems Combining JTAG Testing and Flying Probe Testers

Latest Trends in Hybrid Testing Systems Combining JTAG Testing and Flying Probe Testers

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Announcement of the 20th "JPCA Award" Winner

Announcement of the 20th "JPCA Award" Winner

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Accelerating Inspection of Flying Probe Testers Using Deep Reinforcement Learning [Joint Research Material with Ehime University]

Accelerating Inspection of Flying Probe Testers Using Deep Reinforcement Learning [Joint Research Material with Ehime University]

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Flying Probe Tester APT-1340J/APT-1400F-SL

Flying Probe Tester APT-1340J/APT-1400F-SL

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Feature Article: Latest Trends in BGA Assembly Board Inspection - Hybrid Testing with Flying Probe Testers and JTAG Testing

Feature Article: Latest Trends in BGA Assembly Board Inspection - Hybrid Testing with Flying Probe Testers and JTAG Testing

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Basic Knowledge of In-Circuit Testers

Basic Knowledge of In-Circuit Testers

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Hybrid inspection system combining JTAG testing and flying probe testers.

Hybrid inspection system combining JTAG testing and flying probe testers.

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News about this product(26)

We will exhibit at Productronica 2025 in India.

  • Seminar・Event

We are pleased to announce our participation in an overseas exhibition. Itochu Corporation and MAXIM will be exhibiting at "Productronica India 2025," which will be held in Bangalore, India, from September 17 to 19, 2025, showcasing the TAKAYA flying probe tester. ■ Event Overview Dates: September 17 (Wednesday) to 19 (Friday), 2025   ・September 17-18: 10:00 AM to 6:00 PM   ・September 19: 10:00 AM to 5:00 PM Venue: Bangalore International Exhibition Centre (10th Mile, Tumkur Main Road, Bengaluru 562 123, India) Booth Number: Hall 4, F11 We sincerely look forward to your visit. Please stop by!

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We will exhibit at the IPC APEX EXPO 2025 held in the United States.

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We are pleased to announce our participation in an overseas exhibition. Itochu Corporation and TEXMAC will be exhibiting at the IPC APEX EXPO 2025 held in Anaheim, USA, showcasing the Flying Probe Tester manufactured by Takaya Corporation. Event Overview Date: March 18 (Tuesday) to March 20 (Thursday), 2025 Time: - March 18: 10:00 AM to 6:00 PM - March 19: 9:00 AM to 6:00 PM - March 20: 9:00 AM to 12:00 PM Exhibited Models: APT-2600FD-A (Dual Vertical Probe / Double-Sided Tester) APT-1400F-SL (Dual Vertical Probe / Single-Sided Tester) We sincerely look forward to your visit. We are excited to meet you at the exhibition.

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The global site for the flying probe tester has been renewed.

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Please see the TAKAYA Flying Probe Tester page from the related links below. Takaya Corporation has entered into a dealership agreement with Itochu Corporation for overseas sales, establishing sales/service bases for flying probe testers in the United States, Europe, China, and Southeast Asia, with numerous sales achievements in over 46 countries. We will continue to regularly provide information on agents in various countries and details about our participation in overseas exhibitions. You can also rely on us for the introduction and local setup of flying probe testers at overseas bases.

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I received the Excellent Award at the 38th Electronics Packaging Society Spring Conference.

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From March 13 (Wednesday) to 15 (Friday), 2024, at the "38th Spring Conference of the Electronics Packaging Society" held at Tokyo University of Science, Takaya Corporation presented a lecture titled "Latest Trends in Hybrid Testing Systems Combining JTAG Inspection and Flying Probe Testers," which received the Excellence Award at the conference. On September 12, 2024, a ceremony was held at Daido University in Aichi Prefecture during the "MES2024 Symposium," where we were presented with a commemorative plaque.

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Companynews list (261)

Company information

TAKAYA

TAKAYA Corporation

Industrial Electrical Equipment

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Founded in 1894 as a textile company, Takaya Textile expanded and established its electronics division in 1966, beginning the assembly of transistor radios. Currently, in addition to contract manufacturing services (EMS) related to electronic devices, the company actively manufactures and sells in-circuit testers (printed circuit board inspection devices), RFID-related equipment (technology that enables information exchange through short-range wireless communication from IC information tags), and engages in IT consulting and system solutions, among various electronics businesses both domestically and internationally. We will continue to evolve as a corporate group that contributes to the development of society, with textiles and electronics as our two pillars.

Product/Service List (194)

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