For measuring the thickness of SiO2 films and ITO films! We perform thickness calculations and analyses.
The "SR10-FF" is software that reads measurement data from the "SR-5000" and performs calculations and analyses of film thickness. Under standard specifications, it can measure a range of 0.5μm to 15μm (0.001μm), and with standard plus thin film analysis, it can measure from 0.01μm to 15μm (0.001μm, 0.1nm). For more details about other products, please feel free to contact us. 【Measurement Range】 ■Standard Specifications: 0.5μm to 15μm (0.001μm) ■Standard + Thin Film Analysis: 0.01μm to 15μm (0.001μm, 0.1nm) *For more details, please refer to the PDF document or feel free to contact us.
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From now on, it is expected that various technologies across a wide range of fields will be utilized in various places. To achieve this, we will strive to respond to various scenarios in the fields of research, development, and production. By integrating optics, electronics, mechatronics, and software, we aim to contribute to a wide range of research, development, and production fields centered around "lighting," "materials," and "pharmaceuticals."