It is a surface potential distribution measurement system of the scanning probe microscope type with a cantilever having a tip size of 5μm x 5μm.
It is possible to measure very fine surface potential distributions of about 10μm, which could not be measured with conventional surface potential meters, and it allows for scanning of very wide areas of about several millimeters. It can measure voltages of ±1000V with high precision of 0.5%.
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Product Name: Electrostatic Force Microscope EFM (Electrostatic Force Microscope) very high spatial resolution ESVM system Model: 1100TN Spatial Resolution: Below 10μm Cantilever Tip: 5 x 5 um² Measurement Voltage Range: ± 1000V (maximum ±2000V) Measurement Voltage Accuracy: 0.5% F.S. Measurement Voltage Sensitivity: Up to 20mV Measurement Speed: Up to 30ms/plot Scanning Range: Approximately 5x5mm² maximum Scanning Step Width: Minimum 1um Measurement Mode: Point, Line, 3D
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