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  6. Technical Data: High Spatial Resolution ATR Mapping Measurement (LUMOS II)

Technical Data: High Spatial Resolution ATR Mapping Measurement (LUMOS II)

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last updated:Dec 02, 2024

ブルカージャパン オプティクス事業部
ブルカージャパン オプティクス事業部
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[JASIS2021 Exhibition] LUMOS II - Approaching the diffraction limit of light! High spatial resolution ATR mapping measurement.

The analysis of laminated materials composed of multiple layers with micrometer-scale thickness is one of the important analytical themes, and its influence is showing significant expansion. In this theme, micro-infrared spectroscopy and micro-Raman spectroscopy, which have a mutually complementary relationship, are the most effective analytical methods. The analysis of laminated materials is applied not only to this field but also to a wide range of areas such as biomedicine, pharmaceuticals, and materials science. This document provides a clear explanation of:  ▶ The importance of spatial resolution when applying microspectroscopy to the analysis of laminated materials  ▶ Reports on ATR mapping measurements using the latest micro FT-IR systems *For more details, please refer to the PDF document or feel free to contact us. ◆Exhibition at JASIS2021◆ For information about the exhibition, please check the basic information below.

    Other environmental analysis equipment
AN_M150

Technical Data: High Spatial Resolution ATR Mapping Measurement (LUMOS II)

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AN_M150 toppage.png
  • Related Link - https://www.bruker.com/ja/products-and-solutions/i…

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【Exhibition Participation Information】 We will be exhibiting at 'JASIS 2021'. Date: November 8 (Monday) to November 10 (Wednesday), 2021, 10:00 AM to 5:00 PM Venue: Makuhari Messe International Exhibition Hall Booth Number: 5A-304 *For more details, please refer to the PDF document or feel free to contact us.

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FT-IR imaging microscope "LUMOS II"

FT-IR imaging microscope "LUMOS II"

PRODUCT
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JASIS Burkha Japan Introduction Materials

JASIS Burkha Japan Introduction Materials

COMPANY
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Technical Data: Infrared Emission Spectroscopy Measurement of Microscopic Samples

Technical Data: Infrared Emission Spectroscopy Measurement of Microscopic Samples

TECHNICAL
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Technical Data: Evaluation of Powdered Beverages Using Macro ATR Imaging

Technical Data: Evaluation of Powdered Beverages Using Macro ATR Imaging

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Technical Data: Microplastic Analysis Solutions

Technical Data: Microplastic Analysis Solutions

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New Arrival! [Technical Document] Qualitative Analysis of Inorganic Filler Materials in Polymers Using ATR Method with Far-Mid Infrared Spectrum

New Arrival! [Technical Document] Qualitative Analysis of Inorganic Filler Materials in Polymers Using ATR Method with Far-Mid Infrared Spectrum

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High-precision analysis of silicon wafer surfaces in wafer ATR.

High-precision analysis of silicon wafer surfaces in wafer ATR.

TECHNICAL
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Analysis of micro samples using the integrated FT-IR microscope LUMOS.

Analysis of micro samples using the integrated FT-IR microscope LUMOS.

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Company information

ブルカージャパン

ブルカージャパン オプティクス事業部

Testing, Analysis and Measurement

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The optics business started in 1960 as the infrared spectroscopy division of the Bruker Group in Germany. The range of products developed based on high design philosophy varies from dedicated machines used daily for production management and quality assurance to research models that demonstrate their power in the research and development of advanced materials. With Ettlingen, Germany, as the base for development and manufacturing, we respond to various customer needs through a global sales and service network.

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