Introducing the front and back misalignment / dimensional measurement microscope. Achieved high precision at a low cost.
The "TOMOS-50" is a compact type of measurement system that can simultaneously capture the front and back of electronic components such as crystal oscillators, MEMS, and semiconductors, and measure with an accuracy of ±0.2μm or less. The front and back optical axis correction can be precisely adjusted using a micro stage and software. Additionally, it is also available for sale as a dual-sided microscope module for device integration. Please contact us for more information. 【Features】 ■ Compact type ■ Approximately 3 million pixels ■ Simultaneous capture of both sides, dimensional measurement, and position deviation measurement ■ High-precision correction of the front and back optical axis using a micro stage and software ■ Measurement of position deviation between front and back with a repeatability of ±0.2μm or less (varies depending on conditions) *For more details, please refer to the PDF document or feel free to contact us.
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basic information
【Specifications (Partial)】 ■Optical System ・Body Tube: 2 (Inverted, Upright) ・Objective Lenses: 2 (Selectable from 5x, 10x, 20x, 50x) ・Z Coarse and Fine Adjustment: Manual (Inverted, Upright) ■Measurement Section ・Measurement Reproducibility: ±0.2μm or less (varies depending on measurement conditions) ・PC OS: Windows 10 ・Display Monitor: Dual Screen Display ■Software ・Front and Back Optical Axis Correction Function ・Simultaneous Front and Back Imaging, Image Filing ・Front and Back Dimension Measurement ・Front and Back Position Displacement Measurement, etc. *For more details, please refer to the PDF document or feel free to contact us.
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Applications/Examples of results
【Applications】 ■Observation: Simultaneous observation of the front and back of electronic paper, electrophoresis, particles, fluids, filters, etc. ■Front and back positional displacement measurement: Measurement of positional displacement of inkjet nozzles, quartz oscillators, MEMS, etc. ■Front and back dimensional measurement: Dimensional measurement of quartz oscillators, semiconductor linewidth patterns, etc. *For more details, please refer to the PDF document or feel free to contact us.
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Our company is a comprehensive solution provider for "seeing, viewing, observing, and examining." We handle everything from the development and manufacturing of imaging and optical devices realized through new technologies and bold ideas to system construction. For the development, manufacturing, and sales of professional digital cameras and video-related systems, please leave it to us.
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