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  6. Semiconductor DC burn-in device for testing

Semiconductor DC burn-in device for testing

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last updated:Oct 28, 2022

多摩川電子
多摩川電子
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This is a device that allows for reliability testing by setting arbitrary test conditions for prototype evaluation, mass production, etc.!

The "Semiconductor DC Burn-in Test Device" is a power supply testing device for high-frequency devices (hereinafter referred to as FETs). It performs RF or DC power supply for reliability evaluation and screening during mass production, allowing FETs to be mounted on FET mounting fixtures (hereinafter referred to as fixtures) and enabling burn-in tests under high temperatures. We propose system configurations tailored to the number of channels, FET packages, and testing conditions. 【Features】 ■ Diverse device configurations ■ Strong against oscillation ■ Stable operation possible ■ Applies specified bias voltage to the gate and drain of the FET for power supply ■ Capable of setting arbitrary testing conditions for prototype evaluation, mass production, etc., and conducting reliability tests *For more details, please refer to the product information or feel free to contact us.

    Testing Equipment and Devices
2022-03-17_11h23_11.png

Semiconductor DC burn-in device for testing

2022-03-17_11h23_11.png
2022-03-17_11h23_11.png
  • Related Link - https://www.tmele.jp/product-function/134/

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basic information

【Other Features】 - Depending on the application, you can choose between a hot plate (heater) type and a constant temperature bath type. - Fully automated setup for test conditions, power-on testing, and data acquisition is possible. - The jig shape can be customized to match any FET (spring type, one-touch type). - Utilizing high-frequency circuit technology accumulated since our founding in 1968, we have achieved jigs that are difficult to oscillate. - Compatible with various lineups, and we can flexibly respond to special FETs through in-house development. - Hardware power control suppresses the phenomenon of unstable operation of semiconductors at high temperatures. - Quick power control is possible, ensuring stable operation even at high temperatures. - Equipped with a safety circuit that safely stops the device without damaging the customer's FET. - Even if communication with the measurement PC is interrupted, measurement data can be retained within the device. *For more details, please refer to the product information or feel free to contact us.

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【Usage】 ■Reliability evaluation ■Screening during mass production *For more details, please refer to the product information or feel free to contact us.

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多摩川電子

多摩川電子

Electronic Components and Semiconductors

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High-frequency devices such as attenuators, filters, and switches based on high-frequency wireless technology. As an application, we are expanding the market for measurement instruments for wireless communication. While we focus on original product development, we are also working on miniaturization and cost reduction, providing advanced products that broadly meet market needs.

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