We will introduce numerous analysis cases using AFM scanning probe microscopy, such as structural analysis, elastic modulus measurement, and conductivity measurement.
In this case study collection, we will introduce analysis examples using "AFM: Scanning Probe Microscopy." [Contents] ● Method and results of "Structural analysis and elastic modulus measurement of food (somen)" ● Features and analysis examples of "Conductive measurements of AFM in a vacuum" ● Features and analysis examples of "Conductivity evaluation of material surfaces using AFM" ● "AFM observation of polymer materials (smoothing by microtome)" We conduct various analyses using AFM, which is one of our strengths. We hope you will take a look. There are many other examples not included here. *For more details, please refer to our other PDF materials or feel free to contact us.
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【Details of Publication (Excerpt)】 ■ Structural Analysis and Elastic Modulus Measurement of Food (Somen) - Objective: Conduct structural analysis and elastic modulus measurement of food (somen) - Methods: Multifaceted analysis using ultramicrotome, SEM/EDX, thermal analysis (dynamic mechanical analysis DMA), and AFM (elastic modulus mapping) - Results: Understanding of the structure, components, and elastic modulus of wheat starch granules and gluten (protein) ■ Conductive Measurement of AFM in Vacuum - Features: - Measurement with reduced atmospheric influence (vacuum measurement) - Simultaneous mapping display of shape and conductivity - Measurement area: Up to a maximum level of 150μm² area possible *For more details, please refer to this PDF document or feel free to contact us.
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For more details, please refer to the PDF document or feel free to contact us.
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Seiko Future Creation Co., Ltd. conducts business centered on contract analysis services, research and development, production technology, and FA systems, providing various services aimed at solving customer challenges. Regarding contract analysis, we have a proven track record of solving issues in the development, manufacturing, and quality assurance processes within the Seiko Group, allowing us to respond comprehensively by anticipating the background in various situations. We can handle samples ranging from million-order to nano-order sizes based on our extensive analytical experience primarily in watches and ICs, as well as in printer-related fields. In particular, we tackle customer challenges "from multiple perspectives and comprehensively" using the following technologies: - Microfabrication using a focused ion beam (FIB) device - Thermal analysis of material properties using differential scanning calorimetry (DSC) and others - Observation of microstructure using scanning probe microscopy (AFM) and others - Surface analysis using various devices (XPS, AES, GD-OES) - Cross-sectional observation and structural analysis using various devices (SEM, TEM) Our engineers are available for direct consultations. If you have any concerns, please feel free to reach out to us. *Seiko Future Creation Co., Ltd. changed its name from Seiko I-Techno Research Co., Ltd. on July 1, 2022.
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