Case Study Collection 1 on Cross-Section Observation and Structural Analysis using TEM/SEM/EBSD
We will introduce many examples of cross-sectional observation and structural analysis using TEM, FE-SEM, EBSD, etc., for metal microstructure observation and phase analysis!
This case study collection introduces examples related to "cross-sectional observation and structural analysis." It includes numerous analytical cases covering the objectives, methods, and results of "metallic structure observation of wire (spring material)," "phase analysis of duplex stainless steel," and "evaluation of semiconductor insulating films using STEM-EDS." Additionally, it presents observations, phase analyses, insulating film analyses, and measurements, among other topics. We encourage you to read it. [Contents] ■ Metallic structure observation of wire (spring material) ■ Phase analysis of duplex stainless steel ■ Evaluation of semiconductor insulating films using STEM-EDS ■ EBSD measurement of samarium cobalt magnets ■ Analysis of connector terminal contact defects using STEM ■ Cross-sectional observation of biological samples (Morpho butterfly scales) *For more details, please refer to the PDF document or feel free to contact us.
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【Details of Publication (Excerpt)】 ■ Observation of Metal Microstructure of Wire Material (Spring Material) - Purpose: To investigate the changes in metal microstructure during the processing of spring material (drawing from φ1.00mm to 0.07mm) - Method: SEM-EBSD method - Results: Confirmation of changes in metal microstructure after drawing ■ Phase Analysis of Duplex Stainless Steel - Analysis Case *For more details, please refer to the PDF document or feel free to contact us.
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For more details, please refer to the PDF document or feel free to contact us.
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Seiko Future Creation Co., Ltd. conducts business centered on contract analysis services, research and development, production technology, and FA systems, providing various services aimed at solving customer challenges. Regarding contract analysis, we have a proven track record of solving issues in the development, manufacturing, and quality assurance processes within the Seiko Group, allowing us to respond comprehensively by anticipating the background in various situations. We can handle samples ranging from million-order to nano-order sizes based on our extensive analytical experience primarily in watches and ICs, as well as in printer-related fields. In particular, we tackle customer challenges "from multiple perspectives and comprehensively" using the following technologies: - Microfabrication using a focused ion beam (FIB) device - Thermal analysis of material properties using differential scanning calorimetry (DSC) and others - Observation of microstructure using scanning probe microscopy (AFM) and others - Surface analysis using various devices (XPS, AES, GD-OES) - Cross-sectional observation and structural analysis using various devices (SEM, TEM) Our engineers are available for direct consultations. If you have any concerns, please feel free to reach out to us. *Seiko Future Creation Co., Ltd. changed its name from Seiko I-Techno Research Co., Ltd. on July 1, 2022.
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