Standard equipment in the industry! Satisfactory inspection speed, accuracy, and easy operation.
The "Non-contact 3D Measurement System" offers a wide range of models, from those covering 150mm in the XY direction to models with a maximum movement range of 600mm, providing a broad scanning area. Do you have concerns such as "measurement takes too long," "dissatisfaction with accuracy," or "inability to automate"? The measurement speed is among the best in the industry, and there are models with a rotating stage that can measure the profiles of round parts. You can experience the features of this system through a demonstration unit. 【Features】 ■ Satisfactory inspection speed and accuracy ■ Easy operation ■ The L-CHR sensor is a good choice for speed and accuracy requirements ■ Achieves sub-micron accuracy in both vertical and horizontal measurements without issues ■ The L-CHR sensor has established its position as a standard in semiconductor back-end processes *For more details, please refer to the PDF materials or feel free to contact us.
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basic information
【Other Features】 ■ The machines and software from CyberTechnologies are designed with the assumption that they will be used in production environments. ■ Complex measurement tasks are fully automated, making them easy to handle even for untrained operators. ■ Suitable for materials with different reflectivity, wafers, optical components, mechanical parts, and more. *For more details, please refer to the PDF document or feel free to contact us.
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Applications/Examples of results
【Applications】 ■ Thick film measurement ■ Flatness and warpage measurement ■ Surface roughness measurement ■ Coplanarity of leads and bumps ■ Measurement of transparent films and coatings *For more details, please refer to the PDF document or feel free to contact us.
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Company information
Our company is the exclusive agent in Japan for Besi (BE Semiconductor Industries N.V.) and cyberTECHNOLOGIES (cyberTECHNOLOGIES GmbH). We provide various manufacturing equipment for semiconductor backend processes and high-resolution three-dimensional shape measurement systems. Please feel free to contact us if you have any inquiries.