You can understand the performance comparison of metals and metal compounds in terms of hardness and brittleness, as well as why discoloration issues occur.
Electron Backscatter Diffraction Pattern (EBSD) allows for the following when combined with a Scanning Electron Microscope (SEM): - Separation of phases with different crystal systems - Distribution ratio and crystal orientation analysis for each separated phase In this case, we introduce phase analysis of a two-phase stainless steel using EBSD. With EBSD, the distribution ratio and crystal orientation of the α phase and γ phase in the two-phase stainless steel were confirmed. This measurement technique can be utilized to compare properties such as hardness and brittleness in the distribution of materials in metals and metal compounds, as well as to detect the degree of precipitation and understand its impact on color. We encourage you to give it a try. Additionally, our company conducts various cross-sectional analyses using TEM and surface analysis using XPS, allowing for multifaceted analytical assessments. Our engineers are available to assist directly, so please feel free to consult with us. Seiko Future Creation Official Website https://www.seiko-sfc.co.jp/
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In this case, the following was confirmed: - The distribution ratio of the α phase and γ phase in duplex stainless steel - The crystallographic orientation of the α phase and γ phase in duplex stainless steel This technology can be applied not only to stainless steel but also to other metal materials and metal compounds. We would appreciate it if you could download the catalog for more details. There are many other cases available, so please feel free to contact us.
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Seiko Future Creation Co., Ltd. conducts business centered on contract analysis services, research and development, production technology, and FA systems, providing various services aimed at solving customer challenges. Regarding contract analysis, we have a proven track record of solving issues in the development, manufacturing, and quality assurance processes within the Seiko Group, allowing us to respond comprehensively by anticipating the background in various situations. We can handle samples ranging from million-order to nano-order sizes based on our extensive analytical experience primarily in watches and ICs, as well as in printer-related fields. In particular, we tackle customer challenges "from multiple perspectives and comprehensively" using the following technologies: - Microfabrication using a focused ion beam (FIB) device - Thermal analysis of material properties using differential scanning calorimetry (DSC) and others - Observation of microstructure using scanning probe microscopy (AFM) and others - Surface analysis using various devices (XPS, AES, GD-OES) - Cross-sectional observation and structural analysis using various devices (SEM, TEM) Our engineers are available for direct consultations. If you have any concerns, please feel free to reach out to us. *Seiko Future Creation Co., Ltd. changed its name from Seiko I-Techno Research Co., Ltd. on July 1, 2022.
