Millimeter-level analytical resolution! Fluorescent X-ray analysis of core samples in mineral exploration and geological surveys.
We would like to introduce our "XRF Core Scanner <High Resolution Model>." It quantifies concentrations of matrix elements from trace levels. Using X-ray fluorescence (XRF), it performs elemental analysis and quantification in millimeter and sub-millimeter units for core sample materials from Na to U. Additionally, we also offer a "Simple Model" and a "High Throughput Model." Please feel free to contact us if you have any requests. 【Features】 ■ Analysis resolution in millimeter units, 24-hour automatic analysis ■ Scanning from Na to U (dry samples), Mg to U (wet samples) in one scan ■ Quantification of concentrations from trace levels to matrix elements ■ Magnetic susceptibility measurement, NIR (near-infrared), UV-VIS fluorescence spectroscopy (optional) *For more details, please refer to the PDF document or feel free to contact us.
Inquire About This Product
basic information
【Lineup】 ■Simple Model ■High Throughput Model *For more details, please refer to the PDF document or feel free to contact us.
Price range
Delivery Time
Applications/Examples of results
For more details, please refer to the PDF document or feel free to contact us.
catalog（1）
Download All Catalogs
Company information
As the export and import company of the Japan Spectroscopy Group, we provide analytical instruments and other scientific equipment to overseas markets, and we contribute to researchers around the world by consistently offering comprehensive after-sales service for the import and sale of advanced equipment from abroad.