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  6. For research in organic chemistry and materials science, as well as observations at atomic resolution!

For research in organic chemistry and materials science, as well as observations at atomic resolution!

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last updated:Nov 29, 2024

アズサイエンス 松本本社
アズサイエンス 松本本社
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Introduction to recommended electron microscopes, polarizing microscopes, and mass spectrometers by Azusa Science.

Here are three recommended products: ◆ JEOL Ltd. JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope Equipped with a cold field emission gun (Cold-FEG) and a new spherical aberration corrector (ASCOR) capable of correcting higher-order aberrations as standard, it enables atomic resolution observation not only at a high acceleration voltage of 200 kV but also at a low acceleration voltage of 30 kV. This makes it easier to observe materials containing light elements with clear contrast. ◆ Nikon Solutions Co., Ltd. Polarized/Dispersion Microscope ECLIPSE LV100ND POL/DS This microscope can measure the properties of asbestos, such as refractive index, birefringence, retardation, extinction angle, pleochroism, and elongation, aiding in the identification of asbestos. It allows for dispersion staining observation at a magnification of 400 times. ◆ JEOL Ltd. JMS-T100LP AccuTOF LC-Express Atmospheric Pressure Ionization Time-of-Flight Mass Spectrometer This high-throughput mass spectrometer aims for high productivity with features such as multi-ionization, robustness, and easy maintenance. It is capable of analyzing a wide range of samples from low polarity to high polarity.

    Analytical Equipment and Devices
イプロス 有機.png

For research in organic chemistry and materials science, as well as observations at atomic resolution!

イプロス 有機.png
イプロス 有機.png JEM-ARM200F.png JMS-T100LP.png ECLIPSE LV100ND POL-DS.png
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【Specifications】 ◆NEOARM Atomic Resolution Analytical Electron Microscope Resolution: STEM HAADF image 70 pm (200 kV), 100 pm (80 kV), 160 pm (30 kV) TEM information limit 100 pm (200 kV), 110 pm (80 kV), 250 pm (30 kV) Accelerating voltage: 30 to 200 kV (80, 200 kV – standard, 30, 60, 120 kV – optional) ◆ECLIPSE LV100ND POL/DS Optical system: CFI60 system (infinity-corrected CF optics) Eyepiece: 10X, field number 22, CM type with crosshairs and micrometer Eyepiece graticule included Objective lenses: For polarization: CFI Achromat P 4X, P 10X, LWD P 20X, P 40X, P 100X Oil For dispersion: CFI Achromat 10X DS, CFI Plan Fluor 40X DS2 ◆Atmospheric Pressure Ionization Time-of-Flight Mass Spectrometer DART, LC-MS system, easy exchange of ColdSpray ion source is possible.

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JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope

JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope

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Polarizing/Differential Interference Contrast Microscope ECLIPSE LV100ND POL/DS

Polarizing/Differential Interference Contrast Microscope ECLIPSE LV100ND POL/DS

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JMS-T100LP AccuTOF LC-Express Atmospheric Pressure Ionization Time-of-Flight Mass Spectrometer

JMS-T100LP AccuTOF LC-Express Atmospheric Pressure Ionization Time-of-Flight Mass Spectrometer

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アズサイエンス

アズサイエンス 松本本社

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Since its establishment in 1974, Azusa Science Co., Ltd. has contributed to the local community as a specialized trading company with strengths in both the scientific and medical fields, supporting the advancement of life-pursuing science. We offer a wide range of products in various fields, including physical and chemical instruments, medical devices, testing equipment, analytical instruments, in vitro diagnostic reagents, pharmaceuticals, reagents, and consumables, responding to the increasingly sophisticated and diverse needs of our customers. Furthermore, we are actively advancing software development utilizing our network, working on systematization for our customers and revitalizing communication with them.

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