An inexpensive and simple film thickness measurement system using Ocean Optics spectrometers!
The SKOP (Starter Kit for Optical thickness measurement) optical film thickness measurement system measures the spectral reflectance of optical thin films and determines their thickness by analyzing the spectrum. The thin film on the substrate acts as an etalon, causing an interference pattern in the reflection spectrum. The spacing between the peaks of the sinusoidal pattern correlates with the refractive index of the material and the thickness of the film. In SKOP, the interference pattern is analyzed using dedicated software to convert it into the film thickness.
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basic information
Measurable film thickness range (converted to nd): 1.5 - 70.0 μm (please consult us for other film thicknesses) Actual measurement repeatability (standard deviation): SiO2: 0.001 (@ thickness 1.6 μm) Air: 0.007 (@ thickness 10 μm), 0.01 (@ thickness 30 μm) Si: 0.0003 (@ thickness 1.5 μm), 0.004 (@ thickness 9 μm) Measurement spot diameter: 3.6 mm For detailed specifications, please contact our representative.
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Applications/Examples of results
Si, SiO2, SiN, SiC, LN, coating film on glass/lens, coating film on film
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Company information
Optosirius is a technical trading company that imports and sells spectrometers, measuring instruments, and optical components. Our main products include compact spectrometers from Ocean Optics, which boasts one of the largest market shares in the world, and integrating spheres from Labsphere, which are considered the global standard. Additionally, we handle multi-spectral sensors/multi-spectral cameras, compact and high-speed data-acquisition color luminance meters, switches compatible with multi-mode optical fibers, materials such as quantum dots, and optical components like infrared detectors. A list of manufacturers we represent as authorized import agents, along with detailed information about each manufacturer's products, can be found on our website.
