Classification accuracy verification using the wet classification device S-100W-D. Removal of coarse particles at the individual level. Measurement of the particle diameter of the passed product.
■ Distribution of experimental particles: The cutoff line for coarse particles is set to 5μm due to the 4μm size. A super micro sieve with a diameter of 5.0μm is installed for classification. ■ FPIA-3000 image analysis results: Number of measurements... 0 / 148,000. Maximum particle diameter: 4.27μm. No coarse particles larger than 5μm are present at all. ■ Normally, the image analysis of pass products after classification is conducted with a target measurement count of 200,000 to 300,000 particles × 10 times to verify the reliability of classification accuracy.
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Semtech Engineering Co., Ltd. specializes in ultra-fine processing using electroforming technology, as well as the development and contract manufacturing of ultra-high precision sieves and ultra-high precision fine molds. We excel in ultra-high aspect ratio technology that is impossible with etching, so please feel free to contact us with your inquiries.
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