Grading Technology: After grading, image analysis of on-spec particles - 'Caution: Coarse Particles'
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Verification of classification accuracy using the wet classification device S-100W-D. Image analysis of the particle size of the on-spec particles collected on the screen after classification.
■ Understanding the minute amount of "hidden coarse particles" that is not displayed in the particle size distribution is extremely important in particle manufacturing. ■ "Hidden coarse particles" are expected to be contaminated from the following sources: - Contamination from coarse particles or agglomerates of the same material from the classification device - Contamination from coarse particles of different materials around the classification device, affecting process management - Contamination from dust or other materials from unspecified locations in the manufacturing process ■ Installation of a Φ5μm super micro sieve for analysis of on-spec products after classification shows that coarse particles are certainly captured at the particle count level. If high-precision classification is not performed, there is a possibility that coarse particles, as shown in the upper section of the attached document, are mixed into the product. The maximum coarse particle size is φ10.8μm.
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Semtech Engineering Co., Ltd. specializes in ultra-fine processing using electroforming technology, as well as the development and contract manufacturing of ultra-high precision sieves and ultra-high precision fine molds. We excel in ultra-high aspect ratio technology that is impossible with etching, so please feel free to contact us with your inquiries.