Conduct cross-sectional structural analysis and depth-direction analysis using TOF-SIMS! It is possible to confirm the distribution of components from the surface coating layer to the metal and the coloring components.
As an evaluation of the quality of the printed layer on the metal surface, the bonding state with the metal and the dispersion state of the coloring components can be observed through cross-sectional processing. Additionally, by conducting depth-direction analysis using TOF-SIMS with GCIB from the surface, the distribution of components from the surface coating layer to the metal and the coloring components can be confirmed. Please feel free to contact us when needed. 【GCIB Features】 ■ The energy per ion beam atom is low, making it suitable for depth-direction analysis of organic films and others. ■ High mass number fragments that reflect the molecular structure information of the film can be detected. *For more details, please download the PDF or feel free to contact us.
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Our company offers contract analysis services. Since our establishment in August 2002, we have utilized reliable analysis and measurement technologies along with state-of-the-art equipment to provide optimal nano-level microfabrication, analysis, evaluation of reliability, environmental safety chemical analysis, and service solutions for a wide range of markets centered around semiconductors, liquid crystals, metals, and new materials. Please feel free to contact us if you have any requests.