By using the ion milling method, it is possible to confirm the cross-sectional structure and distribution of elements without damaging the fine structure!
We would like to introduce our "Observation of the Microstructure of Anodized Aluminum." Aluminum materials in commercially available frames form an anodic oxide film (anodizing) on the surface for purposes such as corrosion resistance and wear resistance. In general mechanical polishing processes, the pore structure of the anodized layer can be destroyed, making it impossible to confirm its structure. By using ion milling (Ar+ ion beam) for processing, we can observe the cross-sectional structure and elemental distribution without damaging the microstructure. 【Elemental Distribution Analysis by EPMA】 ■ The microstructure of the anodized layer can be clearly observed through SEM observation. ■ It can be confirmed that the pores are neatly filled due to sealing treatment. ■ By combining elemental analysis, we can also confirm the distribution of Sn (tin), which is thought to have precipitated due to electrolytic coloring on the lower side of the anodized layer, as well as the distribution of S residues in the sulfuric acid bath (H2SO4). *For more details, please download the PDF or feel free to contact us.
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Our company offers contract analysis services. Since our establishment in August 2002, we have utilized reliable analysis and measurement technologies along with state-of-the-art equipment to provide optimal nano-level microfabrication, analysis, evaluation of reliability, environmental safety chemical analysis, and service solutions for a wide range of markets centered around semiconductors, liquid crystals, metals, and new materials. Please feel free to contact us if you have any requests.