Compact angle-resolved photoelectron spectroscopy analyzer
The DA20 offers ARPES in addition to XPS and UPS while maintaining a compact footprint. It is equipped with groundbreaking deflection technology that was previously only available in the larger DA30-L analyzer model, enabling full cone ARPES measurements without rotating the sample. This allows for the mapping of the electronic band structure of the surface Brillouin zone without changing the measurement geometry, eliminating the influence of matrix elements and significantly simplifying the interpretation of results.
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basic information
Specifications Energy resolution < 3 meV FWHM Transmission mode energy range 0.5 eV – 1 500 eV Angular modes ±6°, ±10° Angular mode energy range 3 eV – 1 500 eV Deflection mode energy range 3 eV – 200 eV Deflection mode Spin scan No Operating pressure < 10-5 mbar Mounting flange DN100CF (6" O.D.)
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Company information
On May 28, 2015, VG Scienta and Omicron NanoTechnology merged to start anew as Scienta Omicron. Scienta Omicron Co., Ltd. was established as the general agent in Japan with the aim of making a substantial contribution to research and development in the country. VG Scienta has recognized the importance of photoelectron spectroscopy since its early days and has developed and introduced many related devices to the market as a top global brand. Omicron NanoTechnology has continuously provided cutting-edge technology to the market through its outstanding product lineup, including scanning tunneling microscopes (STM), atomic force microscopes (AFM), and X-ray photoelectron spectroscopy (XPS) systems, all utilizing ultra-high vacuum technology. Moving forward, our mission is not only to provide state-of-the-art evaluation technology-related equipment but also to contribute to the development of science and industry in Japan by offering comprehensive services and technical support. We hope you look forward to our evaluation technologies.