4224ch simultaneous burn-in, maximizing efficiency of LD reliability testing.
BI6201 is a high-density, multifunctional test system specifically designed for burn-in lifetime verification of semiconductor laser chips. By adopting a modular structure and a large-area single-layer design, it integrates multi-channel power supplies, temperature control, real-time data acquisition, standardized drawer structures, and flexible fixture configurations, significantly reducing system costs. ▶ Compatibility with Package and Fixture Flexibility It can accommodate various package shapes and sizes, such as CoC (Chip on Carrier). Custom fixtures are designed for easy one-touch replacement, allowing for quick swaps based on product types. ▶ High Reliability Drive and Protection Features The driver circuit of the BI6201 is equipped with an excellent current/voltage protection network. It is designed to thoroughly eliminate risks of EOS (Electrical Over Stress) such as: - Preventing current/voltage overshoot - Automatically disconnecting the relevant channel if the set threshold is exceeded - Avoiding damage to the test target chip Additionally, the control circuit incorporates isolation performance between channels and ESD (Electrostatic Discharge) protection design, ensuring long-term stable operation and reliability assurance.
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basic information
▶Features High-density, multifunction burn-in system. Supports up to 4224 channels with a four-quadrant SMU power supply. The fixtures can accommodate various CoC packages. ▶Temperature Control Each fixture is equipped with independent control functionality. Temperature stability within ±1℃ (40–100℃) ▶Safety Features EOS prevention circuit, ESD protection, channel-independent shutdown capability ▶Power Monitoring Supports LIV/EA scanning. Reproducibility deviation within ±1% (optional) ▶Software Functionality All test logs are managed in a database and are traceable ▶Scalability Flexible support through fixture replacement and configuration changes
Price information
Excellent cost performance! Please feel free to contact us.
Delivery Time
Applications/Examples of results
Evaluation and implementation are already underway with top-class companies in the industry, and they are actively adopting it.
Detailed information
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Special temperature control structure that achieves excellent thermal conductivity Drawer-type clamp structure compatible with CoC and CoS
Line up（2）
| Model number | overview |
|---|---|
| BI6201 | Up to 4224 channels. 4-quadrant SMU power supply. High-density, multifunction burn-in lifetime verification system. Ideal for reliability evaluation of semiconductor laser chips. |
| BI6202 | Up to 8448 channels. Standard power supply. An expanded model of the BI6201. Designed for higher channel support and high throughput production. |
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Company information
We are a global supplier of advanced testing and measurement equipment. We provide high-performance and highly integrated measurement solutions that can support everything from research and development to mass production processes in cutting-edge fields such as high-speed communication, optical chips, electronic measurement, and power semiconductors. Since our founding, we have placed "Dedication and Craftsmanship" at the core of our corporate values, pursuing product development that combines deep insights into measurement principles with a spirit of craftsmanship. Aiming to be "the best testing solution company supporting global technological innovation," we will continue to provide high-performance, high-efficiency, and highly reliable solutions to address global industrial challenges.
