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  4. Microscopes
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  6. Optical wave field three-dimensional microscope

Optical wave field three-dimensional microscope

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MINUK

last updated:Aug 04, 2025

穂高電子
穂高電子
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Performance that surpasses conventional microscopes: Visualization and quantification of damage and foreign objects in transparent bodies.

This microscope allows for the evaluation of transparent foreign substances and defects on the nanometer order, obtaining height information in a single shot, and measuring in a non-contact, non-destructive, and non-invasive manner. Furthermore, it does not require focusing and can quickly scan any surface to determine measurement positions. Features: - Capable of evaluating transparent foreign substances and defects on the nanometer order - Visualizes the surfaces and bonding interfaces of transparent materials that cannot be confirmed by the naked eye - Instantaneously obtains depth information in a single shot - Enables high-speed measurement without the need for focusing - Allows for non-destructive, non-contact, and non-invasive measurements

    Optical microscope
MINUK写真2_高解像度.jpg

Optical wave field three-dimensional microscope

MINUK写真2_高解像度.jpg
MINUK写真2_高解像度.jpg MINUKのHPデータ1(2).jpg MINUKのHPデータ2.jpg 表面に形成された透明形状2(3).jpg 変化していく透明ゲル2(1).jpg
  • Related Link - https://www.hodaka.co.jp/product_topics/entry32839
  • Special site - Product/service details - https://pr.mono.ipros.com/hodaka-denshi/product/

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Resolution x,y: 691nm (one-shot), 488nm (composite) Field of view x,y: 700×700μm Resolution z: 10nm (phase difference) Field of view z: ±700μm Sample size: 100×80×t20mm (when using a standard sample holder) Sample stage: Micro-movement XY stage (automatic) X: ±10mm Y: ±10mm Coarse movement stage: X: 129mm Y: 85mm Laser: Wavelength: 638nm Output: 0.39mW or less Class 1 (irradiation intensity on the measurement sample) Size (width×depth×height) mm: Main unit: 505 (W) × 630 (D) × 439 (H) *Does not include PC and accessories Weight: 41kg Power consumption: Main unit: 290VA *Does not include PC and accessories

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Visualizing and quantifying the invisible surface of transparent films Shape information on the nanometer scale can be obtained non-contact, non-destructive, and non-invasive. By capturing depth information in a single shot, it is possible to visualize and quantify the cross-sectional shapes of scratches and defects on the surface of transparent films that are not visible to the naked eye. Observing fillers inside transparent films Fillers located inside transparent films, which are not visible to the naked eye, can be observed in a single shot. Additionally, by changing the focus in the depth direction after measurement, it is possible to identify fillers at various depths. Visualizing and quantifying transparent shapes formed on slide glass surfaces It is possible to rapidly visualize and quantify transparent structures formed on surfaces or inside materials that cannot be confirmed visually. Real-time observation of changing transparent shapes on slide glass In single-shot imaging mode, it is possible to visualize and quantify shapes that change moment by moment, such as liquids. This can be utilized for evaluating dynamically changing objects and elucidating the mechanisms of dynamic phenomena.

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穂高電子

穂高電子

Testing, Analysis and Measurement

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Our company is an electronic measuring instrument sales agency established in Yokohama in 1967. We handle current and voltage measuring instruments, frequency measuring instruments, noise and vibration measuring instruments, environmental testing machines, infrared thermography, and more, working to solve the challenges of a wide range of customers, including manufacturers of electrical products, automobile manufacturers, universities, and government agencies. Currently, we are supported by many customers at our nine domestic locations in Tokyo, Yokohama, Atsugi, Hamamatsu, Nagoya, Mie, Kyoto, Osaka, and Okayama, as well as two overseas locations.

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