ARL X’TRA Companion X-ray Diffraction Device (XRD)

basic information

- θ/θ Bragg–Brentano geometry configuration - High-precision goniometer equipped with a stepping motor and optical encoder - X-ray beam collimation using mechanical slits, solar slits, and variable beam knives - Latest generation solid-state pixel detector (55×55 µm pitch) enabling high-speed and high-resolution data collection - Supports automatic analysis with a single-position sample holder or a 6-sample automatic changer - Option to select Cu or Co anode X-ray tubes - Optional integrated water cooling system - Data processing function that allows for Rietveld quantification with one click - Automatic transfer of analysis results to LIMS - Easy installation and operation, flexible deployment in a wide range of environments - Data processing and analysis functions - Qualitative and quantitative analysis of crystalline phases - Calculation of crystallinity - Crystalline polymorph screening - Calculation of lattice constants, crystal grain size, and lattice strain - Rietveld refinement for structural analysis

Price information

Please contact us.

Delivery Time

Applications/Examples of results

Cement, materials science, minerals, geology, nanomaterials, chemistry, pharmaceuticals, energy materials, catalysts, ceramics, polymers, metallurgy, semiconductors, mining, education, etc.