X-ray diffraction test

Ideal for quantitative analysis of environmental dust! X-ray diffraction equipment capable of measurements at high temperatures!

The "X-ray diffraction apparatus" is a device used to investigate the crystal structure, or the name of the material, by measuring the angles and intensities of the diffracted X-rays. From the diffraction positions and integrated intensities during qualitative analysis, quantitative analysis for each material can also be performed using the Rietveld refinement method. Additionally, measurements can be conducted at high temperatures (typically from room temperature to 1300 °C). 【Test Items】 ■ Identification of crystal structure and quantitative analysis ■ Measurement of lattice size and lattice strain ■ Quantitative analysis of environmental dust *For more details, please refer to the catalog or feel free to contact us.

Analytical Equipment and Devices