X-ray diffraction method

basic information

The "crystal" that is the subject of evaluation in XRD refers to a state in which the group of atoms, molecules, or ions that make up a substance is arranged in a three-dimensional repeating pattern. When X-rays are irradiated onto the crystal, they are scattered by the electrons within the crystal (scattered X-rays). The scattered X-rays interfere with each other, and strong diffracted X-rays are produced when the conditions of Bragg's law are satisfied. If we denote the interplanar spacing as d and the angle of incidence of the X-rays as θ, the path difference between the first and second planes is given by 2d sinθ. When the path difference is an integer multiple of the wavelength λ of the incident X-rays, the scattered X-rays reinforce each other, and Bragg's law holds true.

Price information

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Applications/Examples of results

- Evaluation of crystallinity and orientation of poly-Si, metal films, and organic films - Measurement of crystallite size of poly-Si and metal films - Crystal structure analysis of high-k films, nickel silicide (NiSi), and titanium silicide (TiSi) - Degradation evaluation of lithium-ion secondary battery electrode materials

Detailed information

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  Please consult with us first. ★We will start by proposing an analysis plan★ Meetings at your company are, of course, possible. We will carefully explain the analysis results and leave no questions unanswered. Please contact us at 03-3749-2525 or info@mst.or.jp!

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  We will hold a visiting seminar. ★ We offer free seminars with engineers tailored to our customers' needs ★ Depending on your requests, we will introduce analytical techniques and explain analytical data. ◆ Example seminar content - A broad explanation of MST's analytical methods - A thorough and detailed explanation of specific analytical methods from the principles - An explanation of the analytical data requested by the customer Please contact us at 03-3749-2525 or info@mst.or.jp!