For applications such as evaluating the particle size and strain of positive/negative electrode materials in the charge and discharge process of secondary batteries!
We would like to introduce our "Quantitative Analysis of X-ray Diffraction Data Using Rietveld Analysis." By applying Rietveld analysis to X-ray diffraction data, it is possible to quantify the mass fraction of crystalline phases, crystallite size, and uniform strain in the sample without the need for standard samples. Please feel free to contact us if you have any inquiries. 【Features】 ■ Quantification of the mass fraction of crystalline phases, crystallite size, and uniform strain in the sample without the need for standard samples. *For more details, please download the PDF or feel free to contact us.
Inquire About This Product
basic information
For more details, please download the PDF or feel free to contact us.
Price range
Delivery Time
Applications/Examples of results
【Applications】 ■Quantification of impurities mixed during the manufacturing process ■Evaluation of strain before and after hydrogenation of hydrogen storage alloys ■Evaluation of particle size and strain of cathode/anode materials during the charge and discharge process of secondary batteries *For more details, please download the PDF or feel free to contact us.
catalog（1）
Download All Catalogs
Company information
Our company offers contract analysis services. Since our establishment in August 2002, we have utilized reliable analysis and measurement technologies along with state-of-the-art equipment to provide optimal nano-level microfabrication, analysis, evaluation of reliability, environmental safety chemical analysis, and service solutions for a wide range of markets centered around semiconductors, liquid crystals, metals, and new materials. Please feel free to contact us if you have any requests.
![[Analysis Case] Evaluation of Hierarchical Structure of Polymer Materials Using X-ray Diffraction and Scattering Techniques](https://image.mono.ipros.com/public/product/image/387108/IPROS15266811109041940102.png?w=280&h=280)
![[Analysis Case] IGZO](https://image.mono.ipros.com/public/product/image/ac7/2000125858/IPROS8245112958528941451.jpg?w=280&h=280)
![Estimation of Shear Force Using Piezo Wire Sensors [Tokyo Denki University]](https://image.mono.ipros.com/public/product/image/53e/2001508953/IPROS3296565033874700383.PNG?w=280&h=280)
