Ideal for quantitative analysis of environmental dust! X-ray diffraction equipment capable of measurements at high temperatures!
The "X-ray diffraction apparatus" is a device used to investigate the crystal structure, or the name of the material, by measuring the angles and intensities of the diffracted X-rays. From the diffraction positions and integrated intensities during qualitative analysis, quantitative analysis for each material can also be performed using the Rietveld refinement method. Additionally, measurements can be conducted at high temperatures (typically from room temperature to 1300 °C). 【Test Items】 ■ Identification of crystal structure and quantitative analysis ■ Measurement of lattice size and lattice strain ■ Quantitative analysis of environmental dust *For more details, please refer to the catalog or feel free to contact us.
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basic information
【Specifications】 ■Target: Cu, Co, Cr ■Test Temperature: Room temperature to 1500 ℃ (Normal use: up to 1300 ℃) ■Maximum Rated Output: 18 kW (Rotor Flex type) ■Goniometer: Sample horizontal type ■Micro-area Measurement: Minimum φ400 μm ■Automatic Exchange Attachment: 10 samples *For more details, please refer to the catalog or feel free to contact us.
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Applications/Examples of results
【Applications】 ■Identification and analysis of mineral raw materials ■Identification and analysis of precipitates in metals ■Estimation of corrosion environment through identification and analysis of corrosion products *For more details, please refer to the catalog or feel free to contact us.
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Company information
Shin-Ko Welding Service Co., Ltd. is a company that provides testing, research, analysis, and welding training related to the welding and joining of metal materials, based on the rich experience and high technology cultivated over many years at Kobe Steel, a top manufacturer in the welding industry. We strive to be a close partner to our customers, always aiming to be of service.
![[Analysis Case] Identification of Pyrolysis Products by High-Temperature XRD](https://image.mono.ipros.com/public/product/image/2b3/2000244293/IPROS797756027063150607.jpg?w=280&h=280)
![[Analysis Case] Evaluation of Hierarchical Structure of Polymer Materials Using X-ray Diffraction and Scattering Techniques](https://image.mono.ipros.com/public/product/image/387108/IPROS15266811109041940102.png?w=280&h=280)
