[Seminar] A Practical Combination of AI, Machine Learning, and Traditional Research and Development

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last updated：Feb 03, 2026

TH企画

This is a special seminar that provides a detailed explanation of the pitfalls that are often encountered during the introduction and operation of databases, as well as strategies to prevent them!

In this lecture, we will explain the practical ways to combine AI and machine learning for the analysis and utilization of accumulated data with traditional research and development. We will discuss why situations where data sharing and utilization do not progress occur, what problems are inherent in such situations, and how AI and machine learning should be incorporated into actual experimental research. Finally, we will provide specific examples regarding the challenges of maintaining and expanding the collaboration and operation of databases and machine learning, highlighting common pitfalls and ways to avoid them. 【Seminar Overview (Partial)】 ■ Date: March 13, 2026 (Friday) 10:00 AM - 4:00 PM ■ Venue: Online only (Zoom system) ■ Participation Fee (including tax): 49,500 yen per person (including tax) ■ Course Materials: PDF materials (included in the participation fee) *For more details, please download the PDF or feel free to contact us.

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【Acquired Knowledge】 ■Current status of data sharing and utilization in the R&D department ■Causes of the creation of person-dependent data sharing situations ■Problems caused by person-dependent data sharing situations ■What to expect and what not to expect from report sharing ■Characteristics of MI such as machine learning and points to be cautious about ■How to incorporate MI such as machine learning into research ■Why a database is necessary as a data accumulation foundation in the R&D department ■Points to consider when integrating databases and machine learning in the R&D department ■Common pitfalls when implementing a database and strategies to prevent them ■Common pitfalls during database operation and strategies to prevent them, etc. *For more details, please download the PDF or feel free to contact us.