[For Research Institutions] FF35 CT: Improvement of Material Analysis Accuracy

FF35 CT with two types of X-ray tubes, catering to a wide range of material analysis needs.

In material analysis at research institutions, it is important to observe the internal structure of materials in detail and understand their properties. Particularly in the development of new materials and the performance evaluation of existing materials, technologies that can visualize internal structures non-destructively are required. The FF35 CT, with its dual tube configuration of 160 kV nano-focus and 225 kV micro-focus, covers a wide range from ultra-high resolution to thick samples with just one device. By observing the internal structure in detail non-destructively, it allows for the identification of failure causes before proceeding to destructive analysis, thereby improving the speed and success rate of the analysis. 【Usage Scenarios】 ■ Evaluation of internal structures in the research and development of new materials ■ Analysis of degradation or damage in existing materials ■ Detection of foreign matter contamination and defects 【Benefits of Implementation】 ■ Visualization of fine structures within materials enables detailed analysis ■ Non-destructive testing allows for the evaluation of valuable samples as they are ■ Improved research efficiency through early detection of failure causes

X-ray inspection equipment