We provide contracted measurement and analysis services categorized by analysis and evaluation methods, or by materials and devices, depending on the target to be evaluated or the information to be obtained.
Metrix Inc. supports the resolution of research and development and technical issues through contract evaluation and measurement services, analysis support, and technical consulting utilizing eSPM. We conduct "Conductive Atomic Force Microscopy (C-AFM)" to visualize the local current distribution on sample surfaces and assess leakage paths and electrical inhomogeneities. Additionally, we perform "Scanning Spreading Resistance Microscopy (SSRM)" to evaluate local resistance distribution, which is used for analyzing electrical characteristics in semiconductor cross-sections and within devices. 【Services】 ■ Services by Analysis and Evaluation Method - Conductive Atomic Force Microscopy (C-AFM) - Scanning Spreading Resistance Microscopy (SSRM) *For more details, please refer to the related links or feel free to contact us.
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【Services by Material and Device】 ■Semiconductors - Supports local electrical property evaluation of semiconductor and electronic devices, as well as analysis of current distribution and resistance distribution within the devices. ■Battery Materials - Provides contracted measurement and analysis services related to battery materials and energy devices, such as electrode materials and solid electrolyte interfaces. *For more details, please refer to the related links or feel free to contact us.
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For more details, please refer to the related links or feel free to contact us.
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Our company provides contract measurement and analysis services focused on advanced measurement and analysis technologies centered around eSPM (Electrical Scanning Probe Microscopy) for semiconductor, electronic devices, and battery materials, including C-AFM and SSRM. We aim to eliminate bottlenecks in the development of new materials and processes through two-dimensional nanoprobing, accelerating practical application. Even if the analysis conditions are not yet established, please feel free to contact us first. We will listen to your applications and challenges and propose the optimal measurement plan.
![[Analysis Case] Surface Shape Analysis of GaN Substrates](https://image.mono.ipros.com/public/product/image/cce/2001183298/IPROS92166202777756485461.jpeg?w=280&h=280)
![[Analysis Case] Observation of Surface Microstructure of Injection Needles Using AFM](https://image.mono.ipros.com/public/product/image/366/2000337901/IPROS7148448177528455981.jpg?w=280&h=280)
