Contracted service for ion milling processing | JTL
Observation and analysis > Sample preparation service > Cross-section sample production > Ion milling processing service
We will produce cross-sectional samples without any taper using the ion milling method.
We will perform precise sample preparation necessary for high-magnification observation using the ion milling method for cross-sectional processing. In conventional mechanical polishing using polishing paper and abrasives, issues such as deformation due to stress during polishing, collapse of voids, and cracking could occur. Even for samples prone to such phenomena, by performing polishing with a very weak ion beam, we can produce cross-sectional samples suitable for high-magnification observation and analysis of micro-regions, as well as crystal orientation analysis (EBSD).
Inquire About This Product
basic information
**Polishing of Hard and Soft Composite Materials** Processing with ion beams is less affected by differences in material hardness, allowing for polishing with very few irregularities even in hard and soft composite materials. **Ultra-Precision Polishing Suitable for High Magnification Observation and Analysis** Due to the very low load on the sample, a polished surface with minimal deformation is obtained, making it suitable for pre-treatment for observation and analysis at magnifications of around 100,000 times. Voids and cracks do not get crushed, allowing for the acquisition of true sample information. It can also be used for the analysis of thin films, multilayer films, and alloy layers where high magnification analysis is required. **Etching for Crystal Analysis** Ion milling (CP processing) performs etching with ions simultaneously with polishing, making it suitable for observing crystal states and crystal orientation analysis (EBSD). **Dry Polishing and Etching Available** Utilizing ion beams for dry polishing and etching, it is suitable for the analysis of samples that are sensitive to moisture. **Samples Encapsulated in Cups Can Also Be Adjusted** Relatively large samples can be adjusted in a wide chamber area. Samples finished with embedding resin can also be accommodated with planar ion milling.
Price information
The price varies depending on the processing details, so please feel free to contact us.
Delivery Time
※The delivery date may vary depending on the processing details, so please feel free to contact us.
Applications/Examples of results
- Cross-sectional observation and analysis of solder and plating in the implementation infrastructure - Cross-sectional observation and analysis of thin films and multilayer films, as well as film thickness measurement - Observation of voids and cracks in joints such as plating and bonding - Observation of the crystalline state of metallic materials and pre-treatment polishing for EBSP
Company information
Our main business is providing technical services to evaluate the reliability of developed products. We not only provide evaluation data in accordance with standards and regulations, but also propose optimal methods, conditions, and equipment for evaluation purposes, as well as design and manufacture original equipment and jigs for non-standard evaluations. Additionally, we handle three evaluation techniques—measurement, testing, and analysis—comprehensively, allowing us to offer complex services that span diverse equipment and suggest more multifaceted evaluation methods.
![[Analysis Case] Observation of Emulsions in Cryo FIB-SEM Processed Food](https://image.mono.ipros.com/public/product/image/eff/2000246071/IPROS2114051343804807951.jpg?w=280&h=280)
![[Analysis Case] Structural Analysis of DRAM Chips using TEM and SEM](https://image.mono.ipros.com/public/product/image/4af/2000442428/IPROS10654005163802715970.jpg?w=280&h=280)
![[Free Offer] Prevent Blade Troubles in Production Equipment! Non-Stick Thin Film Coating](https://image.mono.ipros.com/public/product/image/fde/2000612726/IPROS23915370847246220159.jpeg?w=280&h=280)
