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  6. Contract analysis services using X-ray fluorescence analysis (XRF) | JTL

Contract analysis services using X-ray fluorescence analysis (XRF) | JTL

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Observation Analysis > Analysis Services > Surface Element Analysis > X-ray Fluorescence Analysis (XRF)

last updated:Jul 22, 2025

JAPAN TESTING LABORATORIES
JAPAN TESTING LABORATORIES
  • Official site

We conduct high-sensitivity analysis of trace elements and light elements suitable for material analysis and foreign substance analysis.

We conduct high-sensitivity analysis of trace elements and light elements using a fluorescent X-ray analysis device (XRF). Our company's XRF device employs wavelength dispersive X-ray analysis (WDX), enabling high-precision qualitative and quantitative analysis. WDX has higher wavelength resolution than energy dispersive X-ray analysis (EDX) and excels in the detection sensitivity of trace elements and light elements. It can be used for material analysis (identification) of metal samples, material analysis of ceramic samples, and measurement of coating thickness.

    X-ray inspection equipmentX-ray fluorescence analyzerContract measurement
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Contract analysis services using X-ray fluorescence analysis (XRF) | JTL

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  • Related Link - https://jtla.co.jp/service/analysis/physical-alana…

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basic information

【Excellent Energy Resolution】 Due to its high energy resolution of around 10 eV, it is possible to analyze peaks that cannot be separated by EDX. 【Analysis of Trace Elements (Quantitative Accuracy of ±100ppm to ±1,000ppm)】 Since one element is analyzed per channel of the spectroscopic crystal, it is suitable for analyzing trace elements in the range of ±100ppm to ±1,000ppm (0.01% to 0.1% order). It can be used for material identification of metal samples and analysis of impurities with low content. 【High-Sensitivity Detection of Trace and Light Elements】 The detection limit for trace elements is around 100ppm (0.01%). (Note: This varies by element.) High-sensitivity analysis for light elements is also equipped with spectroscopic crystals, allowing for high-precision quantification of elements from B to U. 【Diverse Analytical Methods】 Non-destructive analysis using X-rays Simultaneous multi-element analysis (SQX method) Mapping display Material identification of metal samples (SUS, aluminum alloys, copper alloys) Measurement of coating thickness

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The price may vary depending on the analysis content, so please feel free to contact us.

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※The delivery date may vary depending on the analysis content, so please feel free to contact us.

Applications/Examples of results

- Qualitative and quantitative analysis of inorganic foreign substances - Material identification of SUS, aluminum alloys, and copper alloys - Material analysis of ceramics - Non-destructive thickness measurement of coatings - Investigation of impurity content in metal samples - Elemental analysis of contaminants and foreign substances

Company information

JAPAN

JAPAN TESTING LABORATORIES

Testing, Analysis and Measurement

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Our main business is providing technical services to evaluate the reliability of developed products. We not only provide evaluation data in accordance with standards and regulations, but also propose optimal methods, conditions, and equipment for evaluation purposes, as well as design and manufacture original equipment and jigs for non-standard evaluations. Additionally, we handle three evaluation techniques—measurement, testing, and analysis—comprehensively, allowing us to offer complex services that span diverse equipment and suggest more multifaceted evaluation methods.

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