Elemental analysis services by WDX | JTL
Observation Analysis > Analysis Services > Surface Element Analysis > Element Analysis by WDX
We conduct analysis of trace elements and light elements suitable for material analysis and foreign substance analysis.
We provide contract analysis services for trace elements and light elements using wavelength dispersive X-ray analysis (WDX), which is an analytical method of EPMA, FE-EPMA, and XRF. The WDX equipment has superior wavelength resolution compared to energy dispersive X-ray analysis (EDX), allowing for high detection sensitivity of trace elements and light elements. Therefore, it can be used for trace element analysis such as distinguishing metal materials, analyzing the diffusion state of trace elements, and analyzing foreign substances.
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basic information
【Excellent Energy Resolution】 Due to its high energy resolution of around 10 eV, it is possible to analyze peaks that cannot be separated by EDX. 【Analysis of Trace Elements (Quantitative Accuracy of ±100ppm to ±1,000ppm)】 Since one element is analyzed per channel of the spectroscopic crystal, it is suitable for the analysis of trace elements in the range of ±100ppm to ±1,000ppm (0.01% to 0.1%). It can be used for distinguishing metal materials and analyzing the diffusion state of trace elements. 【High-Sensitivity Detection of Trace and Light Elements】 The detection limit for trace elements is approximately 100ppm (0.01%). (Note: This varies by element.) The spectroscopic crystals for high-sensitivity analysis of light elements are also equipped, allowing for high-precision quantification of elements from B to U. 【Spatial Resolution for Micro Areas (Sub-Micron Order)】 FE-EPMA employs a field emission (FE) type electron gun, enabling the acquisition of a micro probe even at low acceleration voltages and WDX analysis current ranges (10 to 100 nA), allowing for high X-ray spatial resolution analysis using low acceleration voltages. The analysis area can be narrowed down to the sub-micron order, enabling mapping at approximately 30,000 times magnification.
Price information
The price may vary depending on the analysis content, so please feel free to contact us.
Delivery Time
※The delivery date may vary depending on the analysis content, so please feel free to contact us.
Applications/Examples of results
- Analysis of the distribution state of trace components in solder - Cross-sectional observation, component analysis, and mapping of alloy layers - Cross-sectional observation, component analysis, and mapping of plating - Cross-sectional metallographic observation, component analysis, and mapping of weld joints - Cross-sectional observation, component analysis, and mapping of minerals - Qualitative and quantitative analysis of inorganic foreign substances - Material identification of metal samples (SUS, aluminum) and ceramic samples - Non-destructive (X-ray) investigation of plating thin films
Company information
Our main business is providing technical services to evaluate the reliability of developed products. We not only provide evaluation data in accordance with standards and regulations, but also propose optimal methods, conditions, and equipment for evaluation purposes, as well as design and manufacture original equipment and jigs for non-standard evaluations. Additionally, we handle three evaluation techniques—measurement, testing, and analysis—comprehensively, allowing us to offer complex services that span diverse equipment and suggest more multifaceted evaluation methods.
![[Test] CHN Analysis (Elemental Analyzer)](https://image.mono.ipros.com/public/product/image/e84/2001123793/IPROS08769414851150897438.jpeg?w=280&h=280)
![[Test] CHN Analysis (Elemental Analyzer)](https://image.mono.ipros.com/public/product/image/f4d/2001210446/IPROS38135277263829886522.png?w=280&h=280)
