Conductive nanoprobes for probing
!! The tip shape is advantageous for multi-probe use with a small inclination angle!! The probe shape has a small inclination angle that takes into account the possibility of adjacent probes not making contact when they approach each other at sharp angles. !! Soft contact with the sample is possible *1 !! The PtIr-coated tungsten probes and platinum-iridium probes, which have surfaces made of platinum-iridium, allow for quick conductivity upon contact due to the absence of an oxide film on the surface. This minimizes damage to both the sample and the probes. Additionally, nickel probes can also achieve quick conductivity upon contact with low contact resistance, similar to platinum-iridium probes. *1: Excluding tungsten probe P-100WP
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basic information
Probing the sample surface using multi-probes at the micro and nanoscale is utilized in the fields of semiconductor device research and development, as well as production, for surface electrical characteristic measurements such as failure analysis of semiconductor devices. In recent years, with the miniaturization of device structures, the specifications required for probes, such as sharpening for inspection and suppression of surface oxide films, have also increased. Furthermore, the demand for such probes is rising in various fields, including nanobiotechnology. To meet these needs, our company has developed contact inspection nano-probes tailored for various applications. We also accept custom coatings for nickel probes, such as gold and silver.
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Applications/Examples of results
We offer a variety of probes suitable for low contact resistance, mild contact measurement, wide contact measurement, and measurements where contact resistance is not a concern.
Line up（2）
| Model number | overview |
|---|---|
| P-100PtIr(P) | [Platinum Iridium Probe] Low contact resistance, suitable for a wide range of contact measurements Tip shape: Conical Wire diameter: 0.5 mm dia. Tip curvature radius: Less than 20 nm Polycrystalline platinum iridium |
| P-100WP | For measurements with minimal influence from contact resistance Tip shape: 0.25 mm dia. Less than 35 nm Polycrystalline tungsten |
Company information
Unisoku was established in 1974 with the aim of becoming a creator of unique measuring instruments. It is a manufacturer that primarily develops and sells its own ultra-high vacuum scanning probe microscopes (SPM) to universities, public institutions, and private companies and research institutes. Over the years, it has developed and commercialized advanced measuring instruments such as high-speed spectroscopic measurement devices and scanning tunneling microscopes, delivering them to universities and research institutions both domestically and internationally, and its technological content has received high praise from researchers in the field of basic research. In recent years, scanning probe microscopes have significantly improved in performance and multifunctionality, particularly as a means of observing sample surfaces at the atomic level. Their applications are expanding mainly from the field of physics to chemistry and bio-related fields, making them indispensable tools in nanotechnology and nanoscience.