Laser microscope suitable for mounting on automatic inspection machines.
【Overview】 By using a laser as the light source for the microscope, stable measurements with a single wavelength are possible. The adoption of DMD (Digital Micromirror Device) for laser scanning enables high-speed and wide-angle deflection, allowing for high-speed image acquisition with a wider field of view than conventional laser microscopes. 【Features】 ● Full-focus images through confocal technology The confocal method is suitable for inspections that require measurements of both plane and height. ● Adoption of short-wavelength laser A 408 nm violet laser, approaching the limit of visible light, is used as the laser wavelength. ● Simultaneous observation function Real-time simultaneous observation of the real image from the laser light source and a 2D color CMOS camera is possible. ● High-speed measurement function With high-speed rendering at 30 frames per second, it is possible to output images and measurement data of the inspection area in almost real-time, making it suitable for implementation in automated inspections. ★ For more details, please request materials or download the catalog ★
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【Overview】 By using a laser as the light source for the microscope, stable measurements with a single wavelength are possible. The adoption of DMD (Digital Micromirror Device) for laser scanning enables high-speed and wide-angle deflection, allowing for high-speed image acquisition with a wider field of view than conventional laser microscopes. 【Features】 ● Full-focus images through confocal microscopy The confocal method is suitable for inspections that require measurements of both flatness and height. ● Adoption of short-wavelength laser A 408 nm violet laser, approaching the visible light limit, is used as the laser wavelength. ● Simultaneous observation function Real-time simultaneous observation of the real image from the laser light source and a 2D color CMOS camera is possible. ● High-speed measurement function With a high-speed rendering of 30 frames per second, it is possible to output images and measurement data of the inspection area almost in real-time, making it suitable for implementation in automated inspections. ★ For more details, please request documentation or download the catalog ★
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At Okura Industry Co., Ltd., in addition to wafer edge profile measurement devices, we design, manufacture, and sell optical and mechatronic equipment such as laser microscopes. We can provide custom solutions for automatic inspection devices and observation evaluation devices that utilize microscopes, flexibly accommodating optimal wavelengths, fields of view, inspection methods, and software for inspections.
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