EBSP measurement hardware/software
Wood significantly varies in strength depending on the direction of its grain. In fact, many metallic materials, including commonly used steel, often exhibit similar anisotropy. It is also known that the strength can change based on the size and distribution of crystal grains. The device that analyzes the organizational structure of this material, focusing on the orientation of the crystals that make up the material, is called OIM (Orientation Imaging Microscopy).
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basic information
【Features】 ○Hardware configuration ○FSD detector ○EBSP detector ●For other functions and details, please contact us.
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Applications/Examples of results
【Purpose】 ○ A device that analyzes the organizational structure of materials by focusing on the orientation of the crystals that make up the material. ● For other functions and details, please contact us.
Company information
Our company is advancing research and development in backscattered electron diffraction (EBSD) technology in collaboration with Dr. David Dingray and Dr. Stuart Wright, who are experts in technical consulting and research and development. Dr. David Dingray (top right photo) is the inventor of the first commercial EBSD system and the founder of TSL. Dr. Stuart Wright is the leader of the software development team and is actively engaged in the research and development of OIM.
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