Pulse I-L Characteristic Test Device MODEL: SEC-PL4000
Pulse I-L Characteristic Test Device MODEL: SEC-PL4000
High-speed pulse driving of laser diodes to measure I-L and I-Vf characteristics!
This device measures the I-L and I-Vf characteristics by driving a laser diode with high-speed pulse operation. It enables the measurement of the kink characteristics of I-L under pulse modulation, which cannot be obtained in CW, down to short pulse widths. The obtained data is displayed and processed on Windows. The LD head is equipped with 4 channels of LD sockets for 5.6Φ and 3.3Φ, so the LD element is mounted in the socket that matches the type of LD being measured (5.6Φ or 3.3Φ). Depending on the measurement conditions set in the software, the LD drive and PD receiving signal are automatically selected and measured using RF SW operation.
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basic information
This device measures the I-L and I-Vf characteristics by driving a laser diode with high-speed pulse operation. It enables the measurement of the kink characteristics of I-L under pulse modulation, which cannot be obtained in CW, down to short pulse widths. The acquired data is displayed and processed on Windows. The LD head is equipped with 4 channels of LD sockets for both 5.6Φ and 3.3Φ, allowing the LD element to be mounted in the socket that matches the type of LD being measured (5.6Φ or 3.3Φ). Depending on the measurement conditions set in the software, the LD drive and PD receiving signal are automatically selected and measured through the operation of the RF switch.
Price information
-
Delivery Time
P4
Applications/Examples of results
This device measures the I-L and I-Vf characteristics by driving a laser diode with high-speed pulses.
Company information
We, System Giken Co., Ltd., are a research and development-oriented company with nearly 50 members, and under our consistent user-first (customer-first) corporate philosophy, we continuously strive for creativity and technological innovation to meet various customer requests. Since our establishment in 1969, we have contributed to the advancement of cutting-edge technology through measurement and evaluation systems for advanced devices. In recent years, we take pride in being highly regarded as a pioneer in measurement and evaluation systems for devices in the optoelectronics field. We sincerely ask for your continued support and encouragement, as we aspire to be a System Giken that meets the expectations of even more people.
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