List of Measurement and Analysis products

High-resolution, high-performance, high-speed, high-precision optical wavelength meter.

• Optical Measuring Instruments

DPSS EO-Q switch nanosecond laser, ideal for applications such as distance measurement.

• Distance measuring device

Wavelength measurement and spectral analysis can be performed with a single unit. It covers the wavelength range from visible light (VIS) to mid-infrared (MIR), from 375 nm to 12 μm.

• Other inspection equipment and devices

Optimal for QCL with high wavelength accuracy, high light removal ratio, and a wavelength range of 1 to 12 μm. Capable of measuring pulsed lasers (>50Hz) and CW lasers.

• Other measurement, recording and measuring instruments

DPSS / LD laser module with up to 6 wavelengths. Wavelengths: 355 to 1550 nm in a compact single package.

• Laser microscope

Compact package containing a maximum of 7 wavelengths of DPSS / LD laser modules (375 to 1550 nm). Up to 300mW per wavelength.

• Laser microscope

It is a compact and cost-effective simple atomic force microscope (AFM). It is ideal for research and educational purposes, as well as for use as a secondary instrument.

• Other microscopes

The YOA-8401 series is a Raman spectrometer equipped with a narrow linewidth laser. It offers models with excitation wavelengths of 785 nm and 532 nm.

• Spectroscopic Analysis Equipment

High-precision interferometer for inspecting the end face quality of optical fibers and optimizing the cutting process.

• Other inspection equipment and devices

Compact and highly stable single-frequency diode-pumped solid-state (DPSS) laser. Ideal for Raman spectroscopy, interference experiments, lithography, and quantum research.

• Laser microscope

Robust armor exterior, compatible with various types of fibers, emission beam diameter from 0.4 to 5.0 mm, supported output (transmission light): 30 to 400 W.

• Optical microscope

OEM support available. Usable in spectroscopy, interferometry, confocal and fluorescence microscopy, bioanalytical research, particle measurement, industrial measurement, holography, and scientific ed...

• Analytical Equipment and Devices

Maximum 2-channel PCI board type module. Two models with base resolution of nanoseconds or picoseconds.

• Optical Measuring Instruments

24-bit AFM controller compatible with discontinued Agilent Technology AFMs, can be replaced.

• Other measurement, recording and measuring instruments

AFM-IR device Spectroscopic Nanoscopy PiFM・PiF-IR

• Other microscopes

Wavelength 375 to 1550 nm. Capable of mounting up to 6 high-power lasers. Supports multi-mode. Wide-field laser illumination.

• Laser microscope

Ultra-low jitter digital sampling oscilloscope. Optimizes test throughput (processing capability). Supports embedded applications.

• oscilloscope

PDT, PIT, and PTT research multi-channel desktop laser. Ideal for research and development in photodynamic therapy, photoimmunotherapy, and photothermal therapy.

• Laser microscope

12-inch wafer. AFM-IR device compatible with 300 mm × 300 mm. Ideal for research and development in nanofabrication and failure analysis.

• Visual Inspection Equipment

A high-precision diffraction system that can comprehensively evaluate the quality of AR light guide plate gratings.

• Optical Measuring Instruments

Achieving automatic image quality testing for AR light guide plates.

• Optical Measuring Instruments

AR/XR glasses, multi-purpose imaging and testing station for subassemblies

• Optical Measuring Instruments

Optical microscope with a resolution of ≦100nm, capable of non-destructive observation in full color.

• Optical microscope

Defect inspection imaging device that visualizes defects in substrates such as glass substrates, semiconductor substrates, and display substrates.

• Circuit Board Inspection Equipment

Optical transceiver test wavelength meter for communication wavelength band compatibility

• Optical Measuring Instruments

OEM Embedded Support Single Cavity Femtosecond Laser

• Spectroscopic Analysis Equipment

Wide response wavelength range, high sensitivity with amplifier, digital & analog output. Versatile photodetector, price excluding tax starting from ¥478,000!

• Optical Measuring Instruments

This is a large sample-compatible model that allows for AFM-IR measurements to be conducted by placing an 8-inch (200mm) wafer directly onto the sample stage.

• Other microscopes

Original PiFM AFM for nanoscale IR chemical analysis

• Other microscopes

High-performance thermography that can obtain high-resolution, high-definition, and high-precision thermal images.

• Thermography