List of Measurement and Analysis products

  • classification:Measurement and Analysis

3556~3600 item / All 55134 items

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Achieves high collection efficiency through electrostatic methods. Offers a wide range of products from large to small sizes. Also compatible with water-soluble oil mist.

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  • air conditioning

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Insights into the permeability of molecules can be obtained from free energy calculations!

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  • Contract Analysis

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Structural analysis of lamellae and similar structures is possible! Similar evaluations can be performed using WAXS (Wide-Angle X-ray Scattering).

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  • Contract Analysis

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By combining actual measurements and simulations, detailed peak attribution is possible!

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  • Contract Analysis

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You can obtain various physical property information such as point defect formation energy, charge, and optical transitions!

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  • Contract Analysis

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Effective for understanding surface reactions at the atomic level in the etching process.

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  • Contract measurement
  • Contract Analysis
  • simulator

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Evaluation of modified layers and altered layers through surface treatment is possible!

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  • Contract measurement
  • Contract Inspection

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It is possible to estimate the cause of wafer contamination!

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  • Contract measurement
  • Contract Inspection
  • Time-of-flight mass spectrometer

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It is possible to evaluate the causes of contamination in vacuum devices, such as oil backs and grease!

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  • Contract measurement
  • Surface treatment contract service
  • Time-of-flight mass spectrometer

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Evaluation of component distribution in hair cross-sections using TOF-SIMS analysis.

  • Contract Analysis

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Visualizing the differences in penetrating ingredients and their distribution based on the type of hair care products used.

  • Contract Analysis

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By performing preprocessing under controlled atmosphere conditions, it is possible to analyze while preventing oxidative degradation.

  • Contract Analysis

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It is possible to achieve high-precision measurements that are not affected by surface irregularities.

  • Contract Analysis

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TOF-SIMS component analysis of slope-polished organic multilayer structure samples.

  • Contract Analysis

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It is possible to accurately evaluate materials through sampling under controlled atmospheric conditions.

  • Contract Analysis

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It is possible to evaluate the composition quantification, in-plane distribution, and depth distribution of thin films.

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  • Contract Analysis

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It is possible to obtain the dopant concentration profile from the SiC substrate side.

  • Contract Analysis

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Identification of odor components using gas chromatography-mass spectrometry.

  • Contract Analysis

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Measurement avoiding the influence of high concentration layers using SSDP-SIMS.

  • Contract Analysis
  • Contract Inspection

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Continuous evaluation of crystallinity and orientation using electron diffraction.

  • Contract Analysis
  • Contract Inspection

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It is possible to analyze aldehydes and VOCs (volatile organic compounds) in indoor air.

  • Contract Analysis

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Identifies the components of foreign substances without the influence of the substrate or base material.

  • Contract Analysis

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Evaluation of the sp2/(sp2+sp3) ratio using C1s waveform analysis.

  • Contract Analysis

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Evaluation will be conducted under measurement conditions tailored to the purpose.

  • Contract Analysis

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XPS: X-ray Photoelectron Spectroscopy AES: Auger Electron Spectroscopy

  • Contract Analysis

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In addition to detailed condition assessment, film thickness calculation is possible.

  • Contract Analysis

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Preventing oxidation degradation during cutting processing under N2 atmosphere.

  • Contract Analysis

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Possible to dismantle and preprocess while maintaining the atmosphere, up to the introduction of equipment.

  • Contract Analysis

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Suppressing changes due to processing through cutting under atmosphere control.

  • Contract Analysis

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TOF-SIMS: Time-of-Flight Secondary Ion Mass Spectrometry

  • Contract Analysis

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By visualizing the mass spectrum, more accurate analysis is possible.

  • Contract Analysis

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Analysis of nitrogen compounds using GC/MS/NPD (Nitrogen Phosphorus Detector).

  • Contract Analysis

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Evaluation of aluminum hydroxide Al(OH)3 and aluminum oxide Al2O3 is possible.

  • Contract Analysis

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Visualization of the distribution of active ingredients in biological tissues using TOF-SIMS.

  • Contract Analysis

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Technical Information 'Evaluation of Transdermal Absorption of Indomethacin (C0428)' Released

We have published the following analysis case on the MST website. - Evaluation of transdermal absorption of indomethacin (C0428) For more details, please visit the MST website. http://www.mst.or.jp/

It is possible to analyze desorbed gases by temperature increase even with transparent samples that allow infrared rays to pass through.

  • Contract Analysis

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Technical Information "De-gassing Evaluation of Plating Samples (C0464)" and 4 other items published.

We have published the following five analysis case studies on the MST website: - Degassing evaluation of plating samples (C0464) - TDS analysis examples by representative materials and purposes (B0232) - Peptide sequence analysis using LC/MS/MS (C0466) - Metal contamination evaluation of Si wafer surfaces (B0233) - Metal contamination evaluation in SiN films (C0465) For more details, please visit the MST website. http://www.mst.or.jp/

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Technical Information "De-gassing Evaluation of Plating Samples (C0464)" and 4 other items published.

We have published the following five analysis case studies on the MST website: - Degassing evaluation of plating samples (C0464) - TDS analysis examples by representative materials and purposes (B0232) - Peptide sequence analysis using LC/MS/MS (C0466) - Metal contamination evaluation of Si wafer surfaces (B0233) - Metal contamination evaluation in SiN films (C0465) For more details, please visit the MST website. http://www.mst.or.jp/

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Technical information "Observation of the surface microstructure of injection needles using AFM" and two other items have been released.

We have published two analysis case studies on the MST website: - Observation of the surface microstructure of injection needles using AFM - Valence evaluation of Sn oxide using XPS For more details, please visit the MST website. http://www.mst.or.jp/

It is possible to evaluate the depth profile of ultra-thin films on the substrate.

  • Contract Analysis

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High-sensitivity analysis of various solutions, such as pure water and wafer cleaning liquids, is possible.

  • Contract Analysis
  • Wafer
  • Water quality testing

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It is possible to evaluate hair components according to the purpose.

  • Contract Analysis

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