Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Sep 03, 2025～Sep 30, 2025
This ranking is based on the number of page views on our site.
1141～1155 item / All 1222 items
TG-DTA-MS Thermogravimetric Differential Thermal Mass Spectrometry
EI method: It is capable of detecting both inorganic and organic compounds, making it suitable for initial qualitative analysis. PI method: It allows detection while maintaining the molecular structure through soft ionization.
![[Analysis Case] Analysis of α-Alumina (α-Al2O3) by TDS](https://image.mono.ipros.com/public/product/image/112/2001514291/IPROS5157883064023306627.jpg?w=280&h=280)
Thermal desorption gas analysis of ceramics
Thermally stable α-alumina is used in a wide range of applications, including heat-resistant materials, semiconductor packages, and components of semiconductor manufacturing equipment. Among these, dense α-alumina is also used as a material for vacuum devices. However, the gases generated when such materials are heated can adversely affect products and equipment, making it important to understand the outgassing from these materials. In this report, we present a case study comparing the outgassing amounts of porous and dense α-alumina using TDS analysis (temperature-programmed desorption gas analysis).
![[Analysis Case] Component Evaluation of Positive and Negative Electrode Binders in Secondary Batteries](https://image.mono.ipros.com/public/product/image/fd8/2001516656/IPROS9471036621621433980.jpg?w=280&h=280)
Identification of organic substances using TOF-SIMS and GS/MS.
The binder for lithium-ion secondary batteries not only serves as an adhesive between active materials but also needs to be insoluble in the electrolyte. Therefore, the selection of suitable materials for both the positive and negative electrodes is crucial. This document presents cases where the components of the binders used in each electrode sheet were identified by measuring the positive electrode binder using TOF-SIMS and the negative electrode binder using GC/MS, and then comparing the results with a materials library database.
![[Analysis Case] XPS Analysis of Metal Pipe Inner Wall Using Combined Cutting Processing](https://image.mono.ipros.com/public/product/image/152/2001516684/IPROS11147847870852698931.jpg?w=280&h=280)
We provide one-stop solutions from sample cutting processing to investigating the causes of discoloration and corrosion.
The inner walls of metal pipes, such as SUS, used in various fields can discolor and corrode due to reactions with incoming gases and liquids, leading to a decline in equipment functionality. Understanding the locations prone to discoloration and corrosion, as well as their causes, is an important issue in equipment maintenance. At MST, we provide a comprehensive evaluation from sample cutting to analysis. This document presents a case study of XPS analysis conducted on the inner walls of SUS pipes used in vacuum equipment, highlighting both normal and discolored areas.
![Accelerating research and development, [new] surface analysis service launched!](https://image.mono.ipros.com/public/product/image/480/2001535453/IPROS2944828896955495055.jpg?w=280&h=280)
Not only the surface, but also up to a depth of 30nm - Quantitative evaluation of the chemical state at the surface and inside the material at the same location and non-destructively!
We have launched a new service using XPS/HAXPES starting in June! For increasingly complex materials and fine structure samples, we can evaluate the composition and chemical bonding states from the surface to the interior of the material (up to ~30nm) at the same location and in a non-destructive manner. - Depending on the elements of interest and the analysis area and depth, we can select the appropriate X-ray source (Al Kα/Mg Kα/Ga Kα/Cr Kα) to achieve evaluation under suitable measurement conditions. - Non-exposure measurements to the atmosphere, Ar monomer/GCIB sputter etching, and heating pretreatment can be combined. - It is possible to evaluate the electronic states of semiconductor samples using UPS/LEIPS (ionization potential/electron affinity/band gap).
![[Analysis Case] Evaluation of Metal Impurities in the Metal Film and Interface of the Device](https://image.mono.ipros.com/public/product/image/19d/2001538620/IPROS12249256516974712398.jpg?w=280&h=280)
Impurities in films and interfaces such as plating can be evaluated using TOF-SIMS.
Impurities from components of the film formation device, target materials, and plating solutions can contaminate the device and have adverse effects, making the qualitative assessment of impurities on surfaces, within films, and at interfaces important. TOF-SIMS can sensitively evaluate unknown elements present on surfaces, within films, and at interfaces in a single measurement due to the following three characteristics: 1. For metallic elements, ions from m/z 1 to 800 can be detected simultaneously in one measurement. 2. Detection sensitivity of a few ppm can be achieved (varies depending on materials and ions). 3. The use of a sputter gun allows for the evaluation of depth distribution.
![[Analysis Case] Metal Contamination Analysis of Si Wafer Surface (B0233)](https://image.mono.ipros.com/public/product/image/387108/IPROS7416718596998562260.png?w=280&h=280)
It is possible to obtain a large amount of metal element information at once through qualitative and semi-quantitative analysis!
We offer metal contamination analysis of Si wafers (B0233). The purpose of metal contamination analysis of Si wafer surfaces using ICP-MS includes not only the contamination assessment of the Si wafer itself but also the evaluation of contamination within semiconductor devices and the assessment of the working environment due to Si wafer exposure. Therefore, the analysis of Si wafer surfaces is conducted for various purposes. ICP-MS analysis allows for the highly sensitive measurement of metal contamination on Si wafer surfaces, and it is also possible to specify the evaluation area according to the purpose. [Measurement Method] ■ [ICP-MS] Inductively Coupled Plasma Mass Spectrometry *For more details, please download the PDF or feel free to contact us.
The world's first wearable breath gas analysis device (gaining attention overseas as a tool for health promotion and anti-aging research!)
The VO2 Master is a wearable device that measures VO2 (oxygen consumption) without the need for cables. It employs the breath-by-breath method (*1) to perform instant analysis within the unit. It communicates via Bluetooth with a dedicated app compatible with iOS and Android phones, allowing for monitoring, storage, and transfer of data. It is also utilized overseas for health promotion and anti-aging research, gaining attention as a powerful tool for understanding individual health conditions in detail. Main Features: - Easy operation - Three types of ventilation sensors - Lightweight design - Data storage and sharing capabilities - Text and CSV output available With minimal dead air space, it simultaneously measures ventilation volume, gas concentration, temperature, and atmospheric pressure (altitude) at the mouth. The built-in thermometer and barometer also allow for the measurement of the temperature and humidity of exhaled breath. *1) Breath-by-breath method: A technique that analyzes each breath to estimate energy expenditure.
![[Specialized OEM Manufacturing of Medical Devices and Analytical Instruments] Development & Manufacturing Achievements of Equipment and Devices](https://image.mono.ipros.com/public/product/image/f44/2000225954/IPROS7093939835683184985.jpg?w=280&h=280)
We have consistently been involved in the development and manufacturing of devices and equipment that are active in medical and analytical applications.
OEM System handles everything from development to manufacturing (mass production) of devices and equipment in an integrated manner. We have numerous achievements with well-known manufacturers both domestically and internationally. If you are struggling with a lack of know-how during development or cannot allocate resources for mass production in-house, please consult with us first.
Lightweight, fast, and high-performance! The definitive portable X-ray fluorescence analyzer!
Light! 1.5kg including the battery Fast! Measurement completed in just a few seconds High precision! Can measure Mg and Al just like high-end models Limited campaign running until 2025!
