IB-19530CP Cross-Section Polisher Section Sample Preparation Device
Achieving multifunctionality by replacing the functional holder.
Japan Electronics Co., Ltd. IB-19530CP Cross-Section Polisher Sample Preparation Device has adopted a multi-purpose stage to meet the diversifying market needs, achieving multifunctionality by exchanging various functional holders. By selecting functional holders according to the application, it can expand its capabilities not only for cross-section milling but also for planar milling, ion beam sputter coating, and more. 〇Features - Automatic processing program - Multi-purpose stage *For more details, please download the PDF or feel free to contact us.
- Company:アズサイエンス 松本本社
- Price:Other