Interferometer Product List and Ranking from 14 Manufacturers, Suppliers and Companies

Last Updated：Oct 15, 2025 Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Interferometer Manufacturer, Suppliers and Company Rankings

Last Updated：Oct 15, 2025 Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

ニデックコート本部 Aichi//Resin/Plastic
ナガタ Oita//Glass and clay products
トライオプティクス・ジャパン Shizuoka//Testing, Analysis and Measurement
4 アイ・アール・システム Tokyo//Trading company/Wholesale
5 三協インタナショナル Tokyo//Trading company/Wholesale

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Interferometer Product ranking

Last Updated：Oct 15, 2025 Aggregation Period:Sep 17, 2025～Oct 14, 2025
This ranking is based on the number of page views on our site.

Oblique Incidence Interference Method Flatness Tester 'FT-17' ニデックコート本部
AK-100ZF Newton Checker System ナガタ
InterOptics' interferometer "OptoFlat" トライオプティクス・ジャパン
[Rental] Small Fizeau-type Dynamic Interferometer AccuFiz アイ・アール・システム
5 White Light Interferometer IMS5600-DS 三協インタナショナル

Interferometer Product List

16～30 item / All 36 items

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Ultra-high stability 2D spectroscopic interferometer GEMINI 2D

We will convert the transient absorption spectroscopy measurement to an advanced two-dimensional spectroscopic device.

- Compact and lightweight (180mm x 180mm footprint, 0.4kg) - Supports OPA and NOPA in the selected wavelength range from UV to near-infrared - Pump-probe spectroscopy for absorption spectra - Achieves high throughput with a 1cm clear aperture, without gratings or input/output slits - Easily integrates with existing optical systems you may have - Sturdy and robust design - Complete all-in-one unit including driver - Rapid support worldwide The GEMINI-2D from NIREOS is a compact, lightweight, and highly stable interferometer that transforms transient absorption spectroscopy measurements into cutting-edge two-dimensional spectroscopic devices. By controlling the time delay between two replicas of the input light from femtosecond laser pulses, it offers unparalleled stability and robustness. *For more details, please download the PDF catalog or contact us.

Company：日本レーザー
Price：Other

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Single frequency solid-state laser, wafer inspection, spectrometer calibration, interferometer support.

Applications in the UV range of 266nm, 355nm, 532nm, and 1064nm. Can be used for wafer inspection, spectrometer calibration, and interferometers.

【EXCITE Series Single Frequency Solid Laser Features】 ● Repetition frequency of 1 to 30 kHz ● Emits short pulse diffraction-limited beam with M2 < 1.6 ● Average output of over 150 mW at 266 nm and 500 mW at 355 nm ● Ultra-stable pulse trace and long coherence length of over 3 m ● Robust design for industrial applications

Company：日本レーザー
Price：Other

Laser Components

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Laser scanning interferometer

Interference fringes appear with a reflection level similar to glossy paper! An interferometer that captures a 50mm change with interference fringes.

The product is an interferometer using laser scanning. Interference fringes appear with a reflection level similar to glossy paper. It captures changes of 50mm with the interference fringes. Starting with the inverted type "LSMi-7000," which easily shows interference fringes when a sample is placed on a glass surface, we also offer the cylindrical type "LSMi-7500" and the upright type "LSMi-8000." Additionally, we handle the ultra-wide field confocal laser scanning imager "LSM-5100-MH," which can measure 3D shapes in a range of 5×50mm. 【Features】 <Inverted Laser Scanning Interferometer "LSMi-7000"> ■ Scanning range is 30mm×50mm, can be observed enlarged on the monitor ■ Capable of inspecting fine scratches, polishing defects, and chips on ceramics, etc. <Cylindrical Laser Scanning Interferometer "LSMi-7500"> ■ Interference fringes can be observed over the entire surface of the cylinder, allowing for precise inspection of the cylinder *For more details, please refer to the PDF document or feel free to contact us.

Company：オプセル
Price：Other

Microscope

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Seismic isolation table, no laser interferometer, FizCam2000

By eliminating or minimizing the need for a seismic isolation platform and using a short-coherence laser, it is possible to select the measurement surface even with multiple interference surfaces present.

By using a short-coherence laser (with a narrow interference range) and creating a spatial delay in one of the two optical systems divided internally, it is possible to perform interference measurements on any two selected surfaces, even in complex optical systems where multiple surfaces overlap. Unlike methods that create non-measurable areas in reflective systems (such as Hindle mirrors), this transmission-type system allows for the measurement of the entire surface in one go. It is ideal for confirming the final performance of secondary mirrors in telescopes, large stepper lenses, and wavefront-preserving optical systems. Additionally, it has now become possible to measure the behavior of the writing process of HDDs in operation, even in overlapping states, which was previously impossible. For detailed materials, inquiries about products, or requests for estimates, please feel free to contact us via the form below or through our company website.

Company：アイ・アール・システム
Price：10 million yen-50 million yen

Optical Measuring Instruments
Microscope
Optical Experimental Parts

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Small Fizeau interferometer

[Free Demo / Affordable Rental] A must-see for those using old interferometers! Interferometer capable of mounting reference surfaces.

=== Are you having trouble with the interferometer currently in use? === ◆ Still using an old interferometer ◆ Need a vibration isolation table due to use in harsh environments... The interferometers we handle are Fizeau-type interferometers that are low-cost and high-performance, allowing standard reference surfaces and reference spheres to be used as they are. 【Features】 - Instant measurement using the Spatial Carrier (Fringe) method instead of the conventional piezoelectric micro-motion scanning - Instant measurement capability means that even with vibrations, data can be analyzed if it can be obtained at least once - Piezoelectric micro-motion method is also possible, allowing for continuity in measurements as before Additionally, it is highly compatible with data from other companies' optical software, making it easy to use! === We also offer demo units and rentals, so please feel free to contact us === ◆ Applications - Measurement of general optical systems - Replacement of existing, outdated interferometers or measurement systems - Reducing time for implementation in manufacturing sites and measurement preparations - Performance demonstration of in-house optical products at exhibitions and customer sites - Evaluation of various optical systems, among others...

Company：アイ・アール・システム
Price：Other

Optical Measuring Instruments

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InterOptics' interferometer "OptoFlat"

Measurement of planar shape using reflection and transmission wavefront measurement! Capable of phase measurement at the sub-nanometer level.

"OptoFlat" is an interferometer manufactured by InterOptics that uses low-coherence interference principles, making it easy to measure flat shapes. It features a compact and stable mechanical design while being more affordable compared to traditional interferometers. By using a high-output LED light source, it generates clear interference fringes without laser speckle interference or internal optical system interference, enabling phase measurements at the sub-nanometer level. 【Features】 ■ Uses low-coherence interference principles ■ Easily measures flat shapes ■ Compact and stable mechanical design ■ More affordable compared to traditional interferometers *For more details, please refer to the PDF document or feel free to contact us.

Company：トライオプティクス・ジャパン
Price：Other

Other measurement, recording and measuring instruments

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White Light Interferometer IMS5600-DS

It is a white light interferometer that can be measured in a vacuum environment and in a clean room.

Absolute distance measurement with nanometer precision High resolution of 30 picometers Sensors and cables suitable for vacuum environments

Company：三協インタナショナル
Price：Other

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Oblique Incidence Interference Method Flatness Tester 'FT-17'

Laser light oblique incidence interferometer compatible with a maximum φ130mm; image analysis using phase shift method.

This involves digitally measuring various samples by analyzing interference fringes obtained from a laser light oblique incidence interferometer using the phase shift method. It is used in research and development of semiconductor wafers (GaN, SiC, sapphire) to improve quality in mass production lines.

Company：ニデックコート本部
Price：Other

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Oblique Incidence Interference Method Flatness Tester 'FT-900'

Laser light oblique incidence interferometer compatible with a maximum φ200mm; image analysis using phase shift method.

This is a digital measurement of various samples by analyzing interference fringes using a phase shift method with a laser light oblique incidence interferometer. It is used in research and development of semiconductor wafers (GaN, SiC, sapphire) to improve quality in mass production lines.

Company：ニデックコート本部
Price：Other

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[Analysis Case] Observation of the Surface Morphology of ZnO Films

Capable of observing large-area surface shapes.

A scanning white light interferometer (optical interferometer) can perform high-precision, non-contact three-dimensional measurements of the surface shape of a sample with "high vertical (Z) resolution (0.1 nm) and a wide (X-Y) measurement field of view (50 μm to 4.2 mm)." It is capable of measuring up to a field of view of 4.2 mm × 4.2 mm.

Company：一般財団法人材料科学技術振興財団　MST
Price：Other

Contract Analysis

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Fabry-Pérot Interferometer "FPI 100"

Optimal for longitudinal mode analysis of semiconductor lasers. Various mirror sets and selectable wavelengths for detectors: 330 .. 3000 nm.

- Optimal for vertical mode analysis of semiconductor lasers - Available wavelength options for various mirror sets and detectors: 330 .. 3000 nm - FSR: 1 GHz - Finesse > 200 (typical value > 400)