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Measurement System Product List and Ranking from 203 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

Measurement System Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

  1. マーポス Tokyo//Testing, Analysis and Measurement
  2. ピーテック Osaka//Medical Devices
  3. メトラー・トレド Tokyo//Testing, Analysis and Measurement
  4. 4 オーシャンフォトニクス Tokyo//Testing, Analysis and Measurement
  5. 5 テクノ大西 Osaka//Electronic Components and Semiconductors
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Measurement System Product ranking

Last Updated： Aggregation Period:Nov 05, 2025～Dec 02, 2025
This ranking is based on the number of page views on our site.

  1. Vascular Age Measurement System "Medical Analyzer" ピーテック
  2. Small Volume Dissolution and Membrane Permeation Measurement System 'μDISS・μFLUX' フィジオマキナ
  3. High-precision, flexible resistivity measurement system 'VR300DSE-2P' 国際電気セミコンダクターサービス
  4. 4 Surface pressure distribution measurement system "I-SCAN" テクノ大西
  5. 5 Light distribution measurement system

Measurement System Product List

286～300 item / All 415 items

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Integrating Sphere Measurement System 'LL8-UV-VIS-NIR'

Integrating Sphere Measurement System 'LL8-UV-VIS-NIR'

Achieving high-precision light measurement for LED optical characteristic evaluation! Calibration with the customer's standard light source is also possible.

The "LL8-UV-VIS-NIR" is a system that automatically controls an integrating sphere, spectrometer, power supply, etc., to efficiently develop and evaluate LEDs, measuring their optical, electrical, and thermal characteristics. The standard calibration light source complies with the U.S. NIST, and the calculations adhere to JIS standards. Calibration with the customer's standard light source is also possible. Additionally, the system supports the development and evaluation of LED devices with comprehensive software that includes features such as graph overlay and statistical processing. 【Features】 ■ Achieves high-precision optical measurement for LED optical characteristic evaluation ■ Automatically controls integrating sphere, spectrometer, power supply, etc., for efficient LED development and evaluation ■ Capable of measuring the optical, electrical, and thermal characteristics of LEDs ■ Supports the development and evaluation of LED devices with comprehensive software ■ Accommodates various options and custom specifications *For more details, please refer to the PDF materials or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Integral sphere quantum efficiency measurement system 'LL8-UV-VIS-NIR'

Integral sphere quantum efficiency measurement system 'LL8-UV-VIS-NIR'

Achieving high-precision optical measurements such as quantum efficiency measurement and LED optical characteristic evaluation! Supports various options and custom specifications.

The "LL8-UV-VIS-NIR" is an integrating sphere quantum efficiency measurement system that uses an excitation light source to measure external quantum efficiency, internal quantum efficiency, excitation wavelength dependence, excitation spectrum, and emission spectrum. To efficiently conduct LED development and evaluation, it automatically controls the integrating sphere, spectrometer, power supply, and other components. It measures the optical, electrical, and thermal characteristics of LEDs. Furthermore, the standard calibration light source complies with US NIST standards, and the calculations adhere to JIS standards. 【Features】 ■ Achieves high-precision optical measurements for quantum efficiency measurement and LED optical characteristic evaluation. ■ Automatically controls the integrating sphere, spectrometer, power supply, and other components for efficient LED development and evaluation. ■ Measures the optical, electrical, and thermal characteristics of LEDs. ■ Calibration is also possible with the customer's standard light source. ■ Supports the development and evaluation of LED devices with comprehensive software. *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Temperature Characteristic Measurement System "LL8-HC"

Temperature Characteristic Measurement System "LL8-HC"

Using a constant temperature bath for temperature control! It is possible to measure a wide range of temperature characteristics from -60℃ to +150℃.

The "LL8-HC" is a temperature characteristic measurement system that can measure optical, temperature, and electrical characteristics with a single unit by automatically controlling the spectrometer, power supply, and constant temperature bath. It can automatically change current, voltage, and temperature while measuring optical and electrical characteristics in real-time under those conditions. Additionally, it is capable of performing time variation measurements at fixed intervals and repeated measurements for a specified number of times. 【Features】 ■ Current and voltage can be driven in DC and pulse modes ■ Reverse bias measurements are also possible ■ Measurement results can be saved, and various analyses can be performed using the analysis processing function ■ Analyzed results can be printed, saved as CSV, or copied to the clipboard ■ The software features a user-friendly display entirely in Japanese *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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"Custom specifications available" Non-contact film thickness measurement system 'FF8'

"Custom specifications available" Non-contact film thickness measurement system 'FF8'

The measurement data can be saved to a file, and re-analysis is possible later with a non-contact film thickness measurement system!

The "FF8" is a non-contact film thickness measurement system that measures the reflectance of samples (interference waveforms) and analyzes film thickness values using FFT (Fast Fourier Transform) and other methods. In addition to film thickness measurement, it can also measure the thickness and refractive index of films and glass. With optional features, it is capable of multi-layer film analysis, curve fitting, microscopy, mapping measurements, color measurement, and component concentration analysis. It is also possible to manufacture continuous measurement functions, traverse mechanisms, and data communication functions, allowing it to be used for inline film thickness measurement. 【Features】 ■ Measures the reflectance of samples and analyzes film thickness values using FFT and other methods ■ Can measure the thickness and refractive index of films and glass in addition to film thickness ■ Measurement data can be saved as files, allowing for re-analysis later ■ Can be used for inline film thickness measurement ■ Custom specifications can also be accommodated *For more details, please refer to the PDF document or feel free to contact us.

  • Optical Measuring Instruments

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Crystal Oscillator Measurement System 'QCM922A'

Crystal Oscillator Measurement System 'QCM922A'

High-speed, high-sensitivity QCM device for analyzing structural changes through the measurement of admittance frequency characteristics!

The "QCM922A" is a quartz oscillator measurement system that also supports the measurement of admittance frequency characteristics. It is a successor to the proven "QCA922" and can simultaneously measure minute mass changes as resonance frequency and viscoelastic changes as resonance resistance. Additionally, it is capable of measuring interactions between biomacromolecules such as proteins. 【Features】 ■ Successor to the proven QCA922 ■ Simultaneous measurement of minute mass changes as resonance frequency and viscoelastic changes as resonance resistance ■ Supports measurement of admittance frequency characteristics ■ Enables high-speed and high-sensitivity measurements up to 30MHz in addition to conventional 9MHz quartz oscillators *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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3D Measurement System "SPACE PROBE"

3D Measurement System "SPACE PROBE"

It is a tool that integrates the model space and physical space in real-time in both directions.

The measurement system "SPACE PROBE" instantly captures measurement results in a 3D CAD space. In addition to conventional measurements, it allows for executing CAD commands during measurement and utilizing measurement points for 3D modeling, enabling the capture of three-dimensional shapes. This tool uniquely integrates the model space (CAD screen) and physical space (measurement space) in a bidirectional and real-time manner, revolutionizing the world of measurement. Since 3D measurement data can be directly used while measuring within modeling commands, it bridges the gap that previously existed between measurement and modeling, allowing for the completion of attractive designs in a short time. For more details, please download the catalog.

  • Other CAD
  • Other CAD related software
  • Modeler

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Body Temperature Measurement System "Face to Face"

Body Temperature Measurement System "Face to Face"

Simple operation with just turning on the power! An alarm will sound when the set temperature is exceeded.

"Face to Face" is a temperature measurement system that can measure temperature and recognize faces in one second. It is safe because it is non-contact, and it operates with simple power-on functionality. An alarm will sound if the set temperature is exceeded. It can be used for employee temperature checks and entry/exit management at company entrances, as well as for customer temperature checks at restaurant entrances. 【Features】 ■ Measures temperature in one second ■ Logs can be output in Excel format ■ Alert function for abnormal notifications ■ Easy installation and use ■ Available in independent stand and tabletop stand options *For more details, please refer to the PDF document or feel free to contact us.

  • Thermometer
  • Other safety and hygiene products
  • Other office supplies

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[Case Study] Multi-Device System in the Incoming Inspection Department for Various Outsourced Products

[Case Study] Multi-Device System in the Incoming Inspection Department for Various Outsourced Products

By being able to make accurate suggestions to the outsourcing partner, we have improved the quality of the parts!

We would like to introduce a case study of implementing a multi-terminal system at an automotive parts manufacturer. The system was introduced in the acceptance inspection area for hundreds of outsourced products, where automation of measurements was challenging. By maximizing the mobility of laptops, we successfully created a database. In particular, it has become possible to immediately compare with data from several years ago, which was difficult for irregular items, significantly increasing the validity of acceptance decisions. Additionally, this has enabled precise feedback to be provided to suppliers, leading to improved part quality. [Overview] ■ Implementation site: Automotive parts manufacturer (Acceptance inspection department for various outsourced products) ■ Implemented system: Major Tracer (multi-terminal system) ■ Reason for implementation: Automation of measurements was challenging *For more details, please refer to the PDF materials or feel free to contact us.

  • 導入事例　1.png
  • Other inspection equipment and devices

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[Case Study] An automated process system that integrates various types of automatic measuring instruments.

[Case Study] An automated process system that integrates various types of automatic measuring instruments.

One-shot solution! It enables the automation of data processing and database creation for the challenging measurement device.

We would like to introduce a case study of implementing an automated process system at an automotive parts manufacturer. To automate the sampling inspection of frequently produced critical mass products, we introduced the "Major Tracer," which provided a one-stop solution for the automation of data processing and database creation with measuring instruments, a previously challenging task. By maximizing the measurement program activation function, we achieved inspections that could be conducted solely by operators who are not familiar with the measuring instruments. Additionally, we incorporated robust management monitoring features, allowing us to establish a nearly complete management system that meets the importance of the products. 【Overview】 ■ Implementation Site: Automotive Parts Manufacturer ■ Implemented System: Major Tracer (Automated Process System) ■ Reason for Implementation: Automation of sampling inspections for frequently produced critical mass products *For more details, please refer to the PDF document or feel free to contact us.

  • 導入事例　2.png
  • Process Control System

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12-inch wafer compatible type CVmap3093 A/B

12-inch wafer compatible type CVmap3093 A/B

12-inch wafer compatible type

This is a CV/IV measurement system using a mercury probe method that excels in reproducibility and safety. It can measure the characteristics of various types of wafers, including Si, compounds, SOI, SiC, and bulk wafers. Users can specify up to 49 measurement sites, enabling mapping measurements of C-V, I-V characteristics, TDDB, Vbd, Qbd oxide breakdown evaluation, Dit, doping concentration, oxide film thickness, Low-k, High-k, and more.

  • Other environmental analysis equipment

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Flat panel compatible type CVmap FP-1

Flat panel compatible type CVmap FP-1

Flat panel compatible type

This is a CV/IV measurement system using a mercury probe method that exhibits excellent reproducibility and safety.

  • Other environmental analysis equipment

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Wireless pressure-sensitive sensor measurement system

Wireless pressure-sensitive sensor measurement system

High-speed wireless transmission of a large amount of sensor information.

We will propose the optimal system while discussing specifications with our customers. We will determine the appropriate hardware and firmware specifications and processing while confirming the timing of sensor value acquisition and the accuracy of the values. Additionally, we will provide applications that can wirelessly transmit the sensor values acquired by the firmware to a PC application, which can utilize CPU power to perform various calculations and display original results. We will introduce a system developed in collaboration with our customers that uses multiple pressure sensors to measure balance ability, an element of locomotive syndrome, in a PDF document. *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Other embedded systems (software and hardware)

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Soil thermal resistance measurement system

Soil thermal resistance measurement system

Soil thermal resistance measurement system

The soil thermal resistance measurement calculation management system developed by Yanamoto Engineering is a soil thermal resistance measurement system using thermal probes, completed with the cooperation of engineering companies affiliated with power companies. Since the components other than the thermal probes consist of commercially available standard equipment, we can offer it at a reasonable price with low design and manufacturing costs. The feature of this system is that it can automatically calculate the thermal resistance g-values at three points: 80 cm, 120 cm, and 160 cm from the surface by reading data from the data logger and manipulating the asymptote. Additionally, the results are accompanied by software that automatically generates reports compliant with ISO 9001, allowing anyone to calculate the soil-specific thermal resistance values without any tedious calculations. The calculated results can be printed in a format that complies with ISO 9001 under the user's company name, enabling direct submission to clients as measurement data in investigation reports. Furthermore, we have adopted manufacturers that can provide traceability certification and calibration compliant with ISO 9001 for all components. For more details, please refer to the materials on our website.

  • Temperature and humidity measuring instruments
  • Other measurement, recording and measuring instruments

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Comprehensive catalog

Comprehensive catalog

Improving productivity with Bloom's onboard measurement device.

Towards the Future: LC50-DIGILOG On-machine measurement has become a standard practice in CNC machining centers over the past 30 years. Since then, the accuracy of the BLUM laser system and its reliability in the machining process have set the benchmark for everything. We have advanced new developments, expanding DIGILOG technology from touch probes to laser measurement systems, achieving even faster, higher precision, and more reliable tool measurement. Additionally, the hardware is equipped with numerous outstanding technological innovations.

  • Other measurement, recording and measuring instruments

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