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Measuring Instrument×ナプソン - List of Manufacturers, Suppliers, Companies and Products

Measuring Instrument Product List

16～18 item / All 18 items

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Non-contact resistance tester "EC-80"

Non-contact resistance tester "EC-80"

Compact and easy-to-use manual non-contact (eddy current method) resistance meter.

The EC-80 is a simple measuring device that allows for measurements by simply placing a sample between the probes. You can easily switch between resistivity and sheet resistance measurement modes. Additionally, measurement conditions can be easily set using the JOG dial. Since it has fixed probes, you will need to choose one type from several probe types before purchase. It can be customized in various ways according to customer requests. 【Features】 ■ Non-contact type ■ Manual type ■ Single-point measurement system *For more details, please contact us or download the catalog.

  • Semiconductors and ICs
  • Other measurement and measuring equipment

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Contact Resistance Tester "DUORES"

Contact Resistance Tester "DUORES"

Handheld sheet resistance meter!

"DUORES" is a handy type sheet resistance measuring device that is easy to carry and easy to use for measurements. It features two types of probes (non-destructive and contact) that can be exchanged according to the measurement target. Simply place or touch the probe, and it will automatically measure. It can be customized in various ways according to customer requests. Additionally, it is available for purchase as just the main unit with the non-destructive probe or just the main unit with the contact probe. [Features] ■ Contact type ■ Exchangeable 2 probes ■ Handy type *For more details, please contact us or download the catalog.

  • Semiconductors and ICs
  • Other measurement and measuring equipment

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Measuring instrument "SRS-2010"

Measuring instrument "SRS-2010"

Customizable spread resistance meter

The "SRS-2010" is a spreading resistance measurement system using a two-probe method. It is capable of determining the resistivity distribution in the depth direction of the sample, the thickness of epitaxial layers, the depth of PN junctions, and the carrier concentration distribution. Analysis can be performed on areas of a few millimeters square, down to pattern areas of several hundred micrometers. The low efficiency is calculated from the measured spreading resistance using a calibration curve. It can be customized in various ways according to customer requests. 【Features】 ■ Two-probe method ■ Capable of analyzing pattern areas ■ Calculation of resistivity *For more details, please contact us or download the catalog.

  • Semiconductors and ICs
  • Other measurement and measuring equipment

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