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Probe Product List and Ranking from 152 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:May 27, 2026～Jun 23, 2026
This ranking is based on the number of page views on our site.

Probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:May 27, 2026～Jun 23, 2026
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. テクノプローブ Chiba//Testing, Analysis and Measurement
  3. テクネ計測 Kanagawa//Testing, Analysis and Measurement
  4. 4 精研 本社 Tokyo//Electronic Components and Semiconductors
  5. 5 インクス Tokyo//Machine elements and parts
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Probe Product ranking

Last Updated： Aggregation Period:May 27, 2026～Jun 23, 2026
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Contact Probe Long Stroke NCP Series サンケイエンジニアリング 本社
  4. Flexible wire サンケイエンジニアリング 本社
  5. 4 Capacitive Moisture Meter Probe M Series 日本ベーカーヒューズ株式会社＆ベーカーヒューズ・エナジージャパン株式会社　 （旧）GEセンシング＆インスペクション・テクノロジーズ株式会社

Probe Product List

391～420 item / All 732 items

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Four-terminal measurement compatible coaxial contact probe (separate type)

Four-terminal measurement compatible coaxial contact probe (separate type)

Four-terminal measurement is now possible in limited installation space!

【Overview】 ○ A single probe incorporates two pins, allowing for the connection of terminals for both current and voltage on one probe. 　　→ This makes it possible to accommodate limited installation space. 　　→ Easy probe replacement! ○ The voltage measurement pin is of a separate type. ○ Heat resistance temperature: Below 60°C ○ Safe current: 3–20A 　(Varies by size. Please contact us for details.) Product details can be confirmed in the catalog. We also manufacture probes tailored to the measurement target and conditions. For more information, please contact us through our website. http://www.sankei-engineering.com/

  • Amplifier
  • Oscillator
  • Inductor Coil
  • Probe

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Resin bush contact probe CPD series

Resin bush contact probe CPD series

The use of resin parts in the sliding section ensures smooth movement is maintained.

【Overview】 - The sliding parts are made of resin. - Durability of sliding parts: over 3 million cycles* - Heat resistance temperature: below 60°C - Safe current: 5-7A* - Mounting flange diameter: 2.2-4.0mm - The probe has a low resistance value, enabling precise measurements with an integrated structure. *Durability and safe current values vary depending on the size of the probe. We will suggest a probe that meets your requirements. For more details, please contact us through our website. ● Sankei Engineering Website ● http://www.sankei-engineering.com/

  • Other electronic parts
  • Resistors
  • Capacitor
  • Probe

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High-speed sliding compatible contact probe CPSK series

High-speed sliding compatible contact probe CPSK series

High durability even during high-speed sliding and under heavy loads.

【Overview】 ○ The sliding parts are made of high-hardness SK material or stainless steel. ○ Durability of sliding parts: over 5 million cycles* ○ Heat resistance temperature: below 100℃ ○ Safe current: 1–7A* ○ Mounting flange diameter: 1.05–4.0mm ○ The integrated structure allows for low resistance values of the probe, enabling precise measurements. ○ A series that is strong against diagonal impacts and high-speed sliding. *Durability and safe current values vary depending on the size of the probe. We can recommend probes that meet your conditions. For more details, please contact us through our website. ● Sankei Engineering Website ● http://www.sankei-engineering.com/

  • Other electronic parts
  • Resistors
  • Capacitor
  • Probe

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Heat-resistant contact probe CPU series

Heat-resistant contact probe CPU series

High-temperature and low-temperature probe

【Overview】 ○ Heat resistance temperature: Below 150–300℃ ○ Durability of sliding parts: Over 200,000 cycles ○ Safe current: 0.8–35A ○ Mounting flange diameter: 0.65–9.0mm ○ Integrated structure with low probe resistance, enabling precise measurements. ○ Probes incorporating heat-resistant springs from the general-purpose CP series. *Durability and safe current values vary depending on the size of the probe. We can suggest a probe that meets your conditions. For more details, please contact us through our website. We also offer contract measurement services for measurements under high and low temperatures (compatible with -180 to 300℃). For details, please contact us through our website. ● Sankei Engineering Website ● http://www.sankei-engineering.com/

  • Terminal Blocks
  • Other electronic parts
  • Other Auto Parts
  • Probe

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Insulation resistance voltage test contact probe (supports 3kV!)

Insulation resistance voltage test contact probe (supports 3kV!)

This is a contact probe that can handle high voltage application. *Measurement jigs can also be manufactured!

With 50 years of experience, we have been manufacturing contact probes used for various measurements. They are also used for insulation resistance tests (such as applying 3kV). Based on the material, shape, surface treatment of the workpiece, and measurement conditions (current value, energization cycle, ambient temperature, measurement speed), we will propose products suitable for your usage conditions. Please contact us through our website first. ★http://www.sankei-engineering.com/★ *We also accept orders for the production of fixtures for electrical measurements. No design drawings are necessary, and you don’t need to have knowledge about electrical measurements! You can request everything from design, concept, measurement methods, processing, assembly, to wiring as a complete package. 【Examples of measurement fixtures】 Measurement fixtures for battery testing (cylindrical batteries, box-type batteries, lamicell batteries, button batteries, etc.) / Measurement fixtures for connector testing / Measurement fixtures for automotive components, etc.

  • Terminal Blocks
  • Probe

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[Contact Probe Selection Service] We will solve the "contact failure" of contact probes.

[Contact Probe Selection Service] We will solve the "contact failure" of contact probes.

No more worrying about frequent probe replacements and error handling! We eliminate contact failures, improving inspection accuracy and reducing costs.

Are you troubled by 'poor contact of the probe that cannot be resolved no matter what you do'? At Sankei Engineering, we directly take your work (inspection target) and conduct actual measurements and experiments on our own equipment, such as contact resistance. Based on the objective numerical data obtained, we investigate the root cause of the contact failure and select and propose the optimal contact probe that leads to reliable improvements. The causes of contact failure in electrical measurements include: - Decreased load due to spring deterioration - Adherence of flux or foreign substances - Mismatch between the contact probe and the measurement work and are diverse, making identification not easy. Therefore, we leverage the knowledge we have cultivated as a contact probe manufacturer to uncover the root causes of contact failure through experiments and measurements. Based on actual measurement data, we propose contact probes that lead to improvements, supported by numerical evidence. We aim to eliminate concerns about measurement failures due to contact issues and create a reliable inspection environment that can be used with peace of mind for a long time. Please feel free to consult us first through the inquiry form on our website or by phone.

  • probe
  • Probe

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[Free Support] Selection of Probes for Power Device Power-On Testing

[Free Support] Selection of Probes for Power Device Power-On Testing

To protect expensive devices, selecting the appropriate contact probe is essential!

The selection of high-current probes used for power device conduction tests needs to be done carefully. Incorrect selection can lead to abnormal heating or sparking, potentially resulting in significant losses such as damage to expensive devices or equipment failure. There are mainly two key points to consider when choosing the appropriate probe: 1. Compatibility of specifications: It is important to select a probe that has sufficient margin for the usable current in the limited space due to device miniaturization. 2. Contact resistance between the probe and the workpiece: Even slight contact resistance can cause measurement errors or abnormal heating, so it is crucial to choose a probe that can maintain stable contact with the workpiece. However, many customers are unsure about "what specific criteria to use for judgment." Therefore, Sankei Engineering offers a "Free Probe Selection Service." We will actually take your measurement workpiece, measure the contact resistance with our equipment, and based on the data obtained, we will select and propose the most suitable probe for your usage environment. Inquiries during the comparison and information-gathering stages are also welcome. Please feel free to consult us through the contact form on our website.

  • probe
  • Other electronic parts
  • Probe

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[Free Support] Selection of Probes for Battery Charge and Discharge Testing

[Free Support] Selection of Probes for Battery Charge and Discharge Testing

How to choose high-current contact probes that can withstand long periods of continuous power supply?

The selection of high-current probes used for battery charge and discharge testing must be done carefully. If the selection is incorrect, it can lead to abnormal heating or sparking, potentially causing workpiece welding or equipment failure. There are mainly two key points to consider when choosing the appropriate probe: 1. Specification compatibility: In charge and discharge cycle tests that involve long periods of continuous current flow, it is important to select a probe that has sufficient current capacity relative to the actual usage current value. 2. Contact resistance between the probe and the workpiece: Even slight contact resistance can cause contact heating during current flow, leading to workpiece welding, so it is crucial to choose a probe that can maintain stable contact with the workpiece. However, many customers struggle with "what specific criteria to use for judgment." Therefore, Sankei Engineering offers a **free probe selection service**. We will take your measurement workpiece and measure the contact resistance using our equipment. Based on the data obtained, we will select and propose the most suitable probe for your usage environment. Inquiries during the comparison and information-gathering stage are also welcome. Please feel free to consult us through the contact form on our website.

  • probe
  • Secondary Cells/Batteries
  • Probe

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[Free Support] Key Points for Selecting Probes for Charge and Discharge Testing

[Free Support] Key Points for Selecting Probes for Charge and Discharge Testing

Selection mistakes lead to serious troubles! We will measure the contact resistance and select the optimal high-current probe for your company free of charge.

The selection of probes for charge and discharge testing of EV batteries and lithium-ion batteries must be done carefully. This is due to the risk of significant issues caused by heat generation in harsh environments where current is applied for longer periods than usual. There are three main important points to consider when choosing the appropriate probe: 1. Compatibility of operating current and specifications If there is not enough margin in the probe's allowable operating current, abnormal heat generation may occur during current flow. 2. Heat resistance of the probe Since heat generation due to prolonged current flow is unavoidable, selecting heat-resistant specifications may help reduce the deterioration (sagging) of the spring. 3. Contact resistance between the probe and the workpiece High contact resistance can cause heat generation at the contact point, potentially leading to deformation or welding of the probe tip. However, there are many customers who say, "I don't know how to specifically judge and choose." Therefore, Sankei Engineering offers a [Free Probe Selection Service]. We will take your workpiece and measure the contact resistance using our equipment, and based on that data, we will propose the most suitable probe for your operating environment. Inquiries during the information-gathering stage are also welcome. Please feel free to contact us through the inquiry form.

  • probe
  • Secondary Cells/Batteries
  • Probe

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[Free Support] Key Points for Selecting Probes for Insulation Resistance Testing

[Free Support] Key Points for Selecting Probes for Insulation Resistance Testing

Selection mistakes lead to "defective products leaking out"? We will measure contact resistance and select the most suitable probe for insulation resistance testing for free.

The selection of probes for insulation resistance testing must be done carefully. If the selection is incorrect, there is a risk of misclassifying defective products as good ones, leading to the worst-case scenario of "defective products entering the market." To prevent this situation, it is crucial to ensure reliable electrical contact between the workpiece and the probe. There are mainly two key points when selecting a probe that creates this situation: 1. Tip shape: A sharp (pointed) shape is recommended. It can penetrate through foreign substances such as oxide films or dirt on the workpiece surface, ensuring stable electrical contact. 2. Spring load: A relatively larger load is recommended. By applying high pressure, stable electrical contact with the workpiece can be achieved. However, many customers struggle with determining which probe will make stable contact with their workpieces. Therefore, Sankei Engineering offers a free probe selection service that leverages our expertise as a probe manufacturer. We will actually take your workpiece, measure the contact resistance value using our equipment, and based on that data, we will select and propose a probe that can ensure more reliable contact with your workpiece. Inquiries during the information-gathering stage are also welcome. Please feel free to consult us through the inquiry form.

  • probe
  • Probe

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NetFlow probe 'nProbe'

NetFlow probe 'nProbe'

Log collection, export NetFlow to any flow collector!

Are you having trouble finding a tool that can dump traffic within the LAN? 'nProbe' operates immediately as a NetFlow probe simply by connecting to a mirror port or TAP. It collects logs for traffic analysis and exports NetFlow to any flow collector. 【Features】 ■ There is a risk of not being able to configure NetFlow 　→ Generates NetFlow v5/v9 and IPFIX in probe mode ■ The protocols for export are not unified 　→ Unifies to NetFlow v5/v9 and IPFIX, sending to any flow collector *For more details, please refer to the PDF document or feel free to contact us.

  • probe
  • Probe

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Pencil Probe "Red Crown 2"

Pencil Probe "Red Crown 2"

It guarantees excellent precision under strict manufacturing conditions that require consistently high reliability.

The "Red Crown2" is a pencil probe that comes in standard specifications (with gasket IP65) or soft touch (without gasket IP54). The main spindle uses a high-precision ball cage and is equipped with connection options tailored to the usage conditions and specifications of the display device. Additionally, we offer the "Digi Crown2," which can be used in combination with Digi Net, and the "Red Crown2 USB," which can be directly connected to various USB host devices. 【Features】 <Red Crown2> ■ The main spindle uses a high-precision ball cage ■ Equipped with connection options tailored to the usage conditions and specifications of the display device ■ In the analog probe specification using LVDT or HBT transducers, it can be used with standard Marpos amplifiers or amplifiers from other manufacturers ■ In addition to connector specifications, a connector-less option is available *For more details, please refer to the PDF materials or feel free to contact us.

  • RED Crown 2_04.jpg
  • RED Crown 2_02.jpg
  • RED Crown 2_03.jpg
  • Other machine elements
  • Other measurement, recording and measuring instruments
  • Probe

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High-precision optical transmission probe "VOP40P"

High-precision optical transmission probe "VOP40P"

Ultra-high precision of 0.25μm and a compact design of the smallest class. An optical probe that maximizes productivity for 5-axis machining and mold measurement.

The VOP40P is an ultra-high precision and extremely compact touch probe equipped with Marposs's optical transmission system. By adopting piezoelectric technology, it guarantees an astonishing repeatability accuracy of within 0.25μm (2σ). With a minimum class size of 40mm in diameter and 50mm in length, it enables highly flexible measurements while minimizing the risk of interference in mold manufacturing and 5-axis machining, where workspace is often limited. Additionally, it features a modulation transmission that is resistant to optical interference and a multi-channel function that can control up to four probes with a single receiver, ensuring high reliability and flexible operation even in harsh working environments.

  • VOP40P_01_VOI.jpg
  • VOP40P_02.jpg
  • Milling machine
  • Machining Center
  • probe
  • Probe

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Introduction to PacketMicro products

Introduction to PacketMicro products

Flexible high-frequency probe station! We have over 15 years of experience and achievements in the industry.

We are introducing the 'PacketMicro products' handled by CSI Global Alliance. We offer robust 40 GHz probes (maximum), customizable probe stations, Dino-Lite microscopes, flexible RF cables, and USB Type-C test fixtures. We solve design challenges in high-speed transmission lines that trouble engineers. 【Features】 ■ Affordable and durable ■ Advanced transmission line testing tools for SI analysis ■ Numerous implementations, including Fortune 100 companies ■ Over 15 years of experience and track record in the industry *For more details, please refer to the PDF materials or feel free to contact us.

  • probe
  • Probe

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Contact Revival Agent New Polycall King

Contact Revival Agent New Polycall King

Contact revival and rust prevention/lubrication are all covered with this one product.

Chemically stable, synthetic oil-based rust preventive lubricant for electrical contacts.

  • others
  • Probe

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MEMS 3-axis accelerometer calibration and inspection device

MEMS 3-axis accelerometer calibration and inspection device

Introduction to the MEMS 3-Axis Accelerometer Calibration and Inspection Device (Static Acceleration Inspection)

The "MEMS 3-axis accelerometer calibration and inspection device" offers a total solution from probe sockets that match the package shape and non-damaging probe sockets to inline automation. We have a lineup that includes the self-contained mass production cell system "ACT-4125C," equipped with a loader-unloader that automatically inspects from low temperatures (-40°C) to high temperatures (+125°C), as well as the manual type for development, "ACT-4125-M22." 【Lineup】 <For Development> ■ Posture holding jig JIG007 ■ Manual type ACT-4125-M22 <For Mass Production> ■ Cell system ACT-4125C ■ Custom system *For more details, please refer to the PDF document or feel free to contact us.

  • Image Processing Equipment
  • Probe

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sglux UV sensor probe

sglux UV sensor probe

A semi-custom UV sensor boasting over 1,730 combinations.

We respond to our customers' needs with high customizability and short delivery times. - Supports small production runs starting from just 1 piece - High resistance to UV exposure → Long lifespan

  • Other optical parts
  • Other measurement, recording and measuring instruments
  • Probe

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3D Fiber Probe by Beat Corporation (Video Available)

3D Fiber Probe by Beat Corporation (Video Available)

The world's most successful 3D microprobe (patented)

• The most successful microprobe in the world (patented) • Small diameter stylus with a tip diameter of 20μm to 500μm • Achieves probing force (less than 0.001N) that allows measurement even on fragile and easily deformed workpieces • The probe ball is evaluated optically, making it the most precise probe on the market • High-resolution scanning probe ensures the highest accuracy even during high-speed scans • Easy operation allows confirmation of the probe ball with a high-magnification optical camera • Roughness measurement compliant with standards • Measurement of side or cylindrical surfaces is also possible

  • 3D measuring device
  • Probe

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Laser-powered electric field probe EFS-Laser

Laser-powered electric field probe EFS-Laser

Rechargeable is already outdated! The 'Laser Power Supply Electric Field Probe' that doesn't require charging.

• Laser power supply – No charging required • Ultra-small size • High resolution, high speed, low noise • Frequency range: 10KHz-6GHz • Electric field strength 0.1V/m-10kV/m • Wide dynamic range • Continuous real-time data streaming • PC computer interface & software included

  • EMC Testing
  • Strength Testing Equipment
  • Other electronic measuring instruments
  • Probe

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Electromagnetic Field Probe Low Frequency Isotropic WP50 Wavecontrol Co.

Electromagnetic Field Probe Low Frequency Isotropic WP50 Wavecontrol Co.

High-performance electric and magnetic field measurement probe 10Hz to 3KHz

【Features】 - Electric and magnetic field measurement - Isotropic and true RMS measurement - Measurements in accordance with international standards IEC62110 & IEC61786

  • EMC Testing
  • Strength Testing Equipment
  • Other electronic measuring instruments
  • Probe

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Mobile Phone Probe WPT GSM-3G-LTE

Mobile Phone Probe WPT GSM-3G-LTE

High-performance mobile phone probe for electric field measurement in 900/1800/2100 bands.

【Features】 - Specific mobile frequency probe - Isotropic & true effective value measurement - High sensitivity 0.04V/m - High interband attenuation

  • EMC Testing
  • Strength Testing Equipment
  • Other electronic measuring instruments
  • Probe

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Wavecontrol Electromagnetic Field Probe WP400-3

Wavecontrol Electromagnetic Field Probe WP400-3

A compact electromagnetic field sensor with a size of only 3cm², capable of measuring both electric and magnetic fields with high precision. Spectrum analysis and FFT measurement are possible.

Complies with IEC/EN62233, IEC/EN62822, and IEC/EN62311 standards. Ideal for measurements where small size and spatial resolution are important. 【Main Features】 - High-precision measurement of electric and magnetic fields with a compact 3cm² electromagnetic field sensor - Isotropic & true RMS measurement - Spectrum analysis - Equipped with FFT mode - Complies with international standards IEC/EN62233, IEC/EN62822, and IEC/EN62311

  • EMC Testing
  • Strength Testing Equipment
  • Other electronic measuring instruments
  • Probe

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Isotropic electric field probe WPF40 capable of measuring up to 40GHz!

Isotropic electric field probe WPF40 capable of measuring up to 40GHz!

High-performance isotropic electric field probe capable of measuring up to 40GHz!

【Features】 - High dynamic range 60dB - Isotropic & effective value measurement - Excellent attenuation - International standard compliance

  • EMC Testing
  • Strength Testing Equipment
  • Other electronic measuring instruments
  • Probe

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Mobile Phone Communication Probe WPT

Mobile Phone Communication Probe WPT

Ideal for evaluating mobile phone base stations. Field strength measurements for 700-900, 1800-1900, 2100, and 2600 bands.

【Features】 - Mobile frequency probe - Isotropic & true effective value measurement - High sensitivity 0.04V/m - High inter-band attenuation - Electric field measurement

  • EMC Testing
  • Strength Testing Equipment
  • Other electronic measuring instruments
  • Probe

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Opening fixed RF current monitoring probe, opening 25mm

Opening fixed RF current monitoring probe, opening 25mm

RF current monitoring probe with fixed opening to expand the scope of EMC pre-compliance test products.

【TBCP1-200】 The TBCP1-200 is a fixed aperture RF current monitoring probe. The probe has a 3dB bandwidth of approximately 200 MHz. The aperture of the RF current monitoring probe is 25 mm. Its transmission impedance is > 14 dB ohms in the range of 40 kHz to 200 MHz. 【TBCP1-250】 The TBCP1-250 is a fixed aperture RF current monitoring probe. The probe shows a very flat response with a 3dB bandwidth of 250 MHz and is characterized and usable in the frequency range of 30 kHz to 250 MHz. The aperture of the RF current monitoring probe is 25 mm. Its transmission impedance is > 16 dB ohms in the range of 300 kHz to 250 MHz. 【TBCP1-500】 The TBCP1-500 is a fixed aperture RF current monitoring probe. The probe shows a very flat response with a 3dB bandwidth of 500 MHz and is characterized and usable in the frequency range of 30 kHz to 500 MHz. The aperture of the RF current monitoring probe is 25 mm. Its transmission impedance is > 15 dB ohms in the range of 300 kHz to 500 MHz.

  • EMC Testing
  • Probe

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Opening fixed RF current monitoring probe, opening 32mm

Opening fixed RF current monitoring probe, opening 32mm

RF current monitoring probe for fixed openings to expand the scope of EMC pre-compliance test products.

【TBCP4-250】 The TBCP4-250 exhibits a very flat response with a 3dB bandwidth of 250 MHz and is characterized and usable in the frequency range of 10 kHz to 250 MHz. The opening of the RF current monitoring probe is 32 mm. Its transfer impedance is close to 14 dB ohms in the range of 400 kHz to 250 MHz. 【TBCP4-500】 The TBCP4-500 exhibits a very flat response with a 3dB bandwidth of 500 MHz and is characterized and usable in the frequency range of 10 kHz to 500 MHz. The opening of the RF current monitoring probe is 32 mm. Its transfer impedance is close to 16 dB ohms in the range of 400 kHz to 500 MHz. 【TBCP4-750】 The TBCP4-750 exhibits a very flat response with a 3dB bandwidth of 750 MHz and is characterized and usable in the frequency range of 10 kHz to 800 MHz. The opening of the RF current monitoring probe is 32 mm. Its transfer impedance is close to 20 dB ohms in the range of 400 kHz to 750 MHz.

  • EMC Testing
  • Probe

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Opening fixed RF current monitoring probe, opening 17mm

Opening fixed RF current monitoring probe, opening 17mm

RF current monitoring probe with fixed opening to expand the scope of EMC pre-compliance test products.

The TBCP3-1000 is a fixed aperture RF current monitoring probe. It has a very flat response with a 3dB bandwidth of 1 GHz and is characterized and usable over a frequency range of 30 kHz to 1 GHz. The aperture of the RF current monitoring probe is 17 mm. Its transfer impedance is close to 20 dB ohms in the range of 3 MHz to 1 GHz. Tekbox provides calibration fixtures compatible with the TBCP3 series of fixed aperture current probes.

  • EMC Testing
  • Probe

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Snap-on 32mm RF current monitoring probe, maximum 750MHz

Snap-on 32mm RF current monitoring probe, maximum 750MHz

RF current monitoring probe with fixed opening to expand the scope of EMC pre-compliance test products.

The TBCP2-250 shows a very flat response with a 3dB bandwidth of 250 MHz and is characterized over a frequency range of 30 kHz to 300 MHz. Upon request, a test protocol covering a frequency range of 1 kHz to 350 MHz can also be provided. Its transmission impedance is > 12 dB ohms in the range of 700 kHz to 300 MHz. The TBCP2-500 shows a flat response with a 3dB bandwidth of 500 MHz and is characterized over a frequency range of 30 kHz to 600 MHz. Upon request, the test protocol can be extended to frequencies up to 1 kHz. Its transmission impedance is > 15 dB ohms in the range of 1 MHz to 500 MHz. The TBCP2-750 shows a very flat response with a 3dB bandwidth of 750 MHz and is characterized over a frequency range of 30 kHz to 800 MHz. Upon request, the test protocol can be extended to frequencies up to 1 kHz. Its transmission impedance is > 15 dB ohms in the range of 1 MHz to 750 MHz. The opening of the RF current monitoring probe is 32 mm.

  • EMC Testing
  • Probe

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Coaxial RF current monitoring probe 10Hz to 600MHz

Coaxial RF current monitoring probe 10Hz to 600MHz

Equipped with a 3dB bandwidth from 400kHz to 600MHz and a very flat response from 1MHz to 200MHz.

**Product Overview** The TBCCP1-400K600 is a coaxial RF current monitoring probe that expands Tekbox's range of affordable EMC pre-compliance test equipment. This probe features a 3 dB bandwidth from 400 kHz to 600 MHz and a very flat response from 1 MHz to 200 MHz. The transimpedance is characterized over a frequency range of 10 Hz to 100 MHz. The TBCCP1-400K600 is primarily designed as a transducer for passive loop antennas or for measuring RF current in coaxial cables. The probe is equipped with an N connector and can be connected to a standard tripod via an attachment with a ¼ inch screw.

  • Other electronic measuring instruments
  • EMC Testing
  • Probe

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Coaxial RF current monitoring probe 10Hz to 100MHz

Coaxial RF current monitoring probe 10Hz to 100MHz

Equipped with a 3dB bandwidth from 3kHz to 100MHz and a very flat response from 9kHz to 30MHz.

**Product Overview** The TBCCP1-3K100 is a coaxial RF current monitoring probe that expands Tekbox's range of affordable EMC pre-compliance testing equipment. This probe features a 3 dB bandwidth from 3 kHz to 100 MHz and a very flat response from 9 kHz to 30 MHz. The transimpedance is characterized over a frequency range of 10 Hz to 100 MHz. The TBCCP1-3K100 is primarily designed for use as a converter for active loop antennas or for measuring RF current in coaxial cables. The probe is equipped with an N connector and can be connected to a standard tripod via an attachment with a ¼ inch screw.

  • Other electronic measuring instruments
  • EMC Testing
  • Probe

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