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Probe Product List and Ranking from 154 Manufacturers, Suppliers and Companies

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

Probe Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. サンケイエンジニアリング 本社 Kanagawa//Manufacturing and processing contract
  2. テイエスエスジャパン Tokyo//Industrial Electrical Equipment
  3. ウェーブクレスト Saitama//Industrial Electrical Equipment
  4. 4 テクノプローブ Chiba//Testing, Analysis and Measurement
  5. 5 TESPRO CO.,LTD. Tokyo//Industrial Electrical Equipment
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Probe Product ranking

Last Updated： Aggregation Period:Oct 15, 2025～Nov 11, 2025
This ranking is based on the number of page views on our site.

  1. Contact Probe CP Series (General Purpose) サンケイエンジニアリング 本社
  2. Connection terminal TA series サンケイエンジニアリング 本社
  3. Flexible wire サンケイエンジニアリング 本社
  4. 4 Examples of probes for electromagnetic and eddy current thickness gauges.
  5. 4 Probe Mounting Adapter Socket AS Series サンケイエンジニアリング 本社

Probe Product List

196～210 item / All 661 items

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LF-B 3 (H field magnetic field probe)

LF-B 3 (H field magnetic field probe)

You can approach difficult-to-access printed circuit boards, etc., that are sandwiched between components from above!

The "LF-B 3 Magnetic Field Probe" is a passive near-field probe, with the internal coil arranged perpendicular to the shaft. When the probe head is used vertically against the assembly or device being measured, accurate measurements can be obtained. This product detects magnetic field lines radiating at a 90° angle from the object being measured and does not detect magnetic field lines entering from the side. Langer's near-field probes are compact and very easy to use, and they are electrically well-shielded by a current-damping sheath. 【Specifications】 ■ Type: Near-field Probe ■ Size: Φ4mm Probe Head ■ Frequency Range: 100kHz to 50MHz ■ Connector: SMB male, Jack ■ Resolution: 2mm *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

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LF-K 7 (H field magnetic field probe)

LF-K 7 (H field magnetic field probe)

Half-circular magnetic field lines are generated along the edges of linear, rod-shaped components, cable connectors, and flat structural parts.

The "LF-K 7 Magnetic Field Probe" is a passive near-field probe that detects semicircular magnetic field lines using two coils. The probe functions like a coupling clamp. Unlike the "LF-U 5" probe, it does not detect magnetic field lines entering from the side. The magnetic field enters through the first coil, curves in a circular shape within the probe head, and detects the uneven magnetic field exiting through the second coil. It does not detect overlapping uniform magnetic fields. 【Specifications】 ■ Type: Near-field probe ■ Size: 6×10mm probe head ■ Frequency range: 100kHz to 50MHz ■ Connector: SMB male, Jack ■ Resolution: 5mm *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

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MFA 01 Set (Active Magnetic Field Probe)

MFA 01 Set (Active Magnetic Field Probe)

Each microprobe has a built-in preamplifier! The delivery includes correction data.

The "MFA 01 Set" includes three high-resolution magnetic field microprobes capable of measuring magnetic fields up to 6GHz in signal conductors (150μm), SMD components, or IC pins, along with a bias tee and a dedicated cable. Each microprobe has a built-in preamplifier. The preamplifier (9V, 100mA) is powered through a bias tee BT 706 with a 50-ohm impedance, and the magnetic field microprobes are connected to a spectrum analyzer or oscilloscope via the BT 706. 【Specifications】 ■ Type: PCB Emission Near-Field Microprobe ■ Supported Frequency Range: 1MHz to 6GHz *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

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MFA-K 0.1-12 (Magnetic Field Microprobe)

MFA-K 0.1-12 (Magnetic Field Microprobe)

Equipped with a very small probe head that functions like a coupling clamp, it is suitable for measuring RF magnetic fields up to 6 GHz.

The "MFA-K 0.1-12 Magnetic Field Microprobe" is an active near-field microprobe that requires a BT 706 bias tee to operate. It is capable of measuring current on IC pins and fine conductive paths (150μm) on components. It has the same basic structure as the "MFA-K 0.1-30," but with different frequency characteristics. Thanks to its special probe head design, it does not detect magnetic field lines generated from adjacent conductors. 【Specifications】 ■ Type: Near-field Microprobe ■ Size: Microchip size ■ Supported Frequency Range: 100MHz to 6GHz ■ Connector: SMA female, Jack ■ Resolution: 200μm *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

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MFA-R 0.2-75 (Magnetic Field Microprobe)

MFA-R 0.2-75 (Magnetic Field Microprobe)

Equipped with a very small and high-resolution probe head, it is suitable for measuring RF magnetic fields up to 1 GHz.

The "MFA-R 0.2-75 Magnetic Field Micro Probe" is an active near-field microprobe that requires a BT 706 bias tee to operate. The probe head has a built-in preamplifier (9V, 100mA), and power is supplied through the BT 706 with an impedance of 50Ω, allowing connection to a spectrum analyzer or oscilloscope via the BT 706. Langer's near-field microprobes are ultra-compact and very easy to use, and they are electrically well-shielded due to the current-damping sheath. 【Specifications】 ■ Type: Near-field microprobe ■ Size: Microchip-like ■ Frequency range: 1MHz to 1GHz ■ Connector: SMA female, Jack ■ Resolution: 300μm *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

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MFA-K 0.1-30 (Magnetic Field Microprobe)

MFA-K 0.1-30 (Magnetic Field Microprobe)

Equipped with a very small probe head that functions like a coupling clamp, it is suitable for measuring RF magnetic fields up to 1 GHz.

The "MFA-K 0.1-30 Magnetic Field Microprobe" is an active near-field microprobe that requires a BT 706 bias tee to operate. The direction of the coil in the probe head is marked with a black dot, so please check the orientation before measurement. Additionally, the delivery includes calibration data. Please use the calibration data to convert the probe's output voltage to either the magnetic field or the current flowing through the conductor. 【Specifications】 ■ Type: Near-field Microprobe ■ Size: Microchip size ■ Supported Frequency Range: 1MHz to 1GHz ■ Connector: SMA female, Jack ■ Resolution: 200μm *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

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CM-SHP Custom Probe

CM-SHP Custom Probe

Langer Corporation also manufactures special-shaped near-field probes according to customer requirements!

At Teess Japan Co., Ltd., we handle the "CM-SHP Custom Probe." Langer manufactures special-shaped near-field probes according to customer requirements. Please feel free to contact us when you need assistance. 【Specifications】 ■ Type: Near-field Probe *For more details, please refer to the related links or feel free to contact us.

  • EMC/Static electricity measuring equipment

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OCT probe

OCT probe

A wide variety of probes are available, including handheld types and microscope types!

We offer "probes" that can be used as custom options for the SS-OCT system and OEM products. We have a variety of probes in our lineup, including the "handheld type," which is used by pressing it against the sample, and the "microscope type," which allows for measurements while confirming the measurement position. 【Features】 ■ Handheld Type - Measures by pressing against the sample held in hand - Distance to the measurement object can be changed with attachments, enabling 3D measurements ■ Microscope Type - High-precision sample positioning using an XYZ stage - Allows for measurements while confirming the measurement position *For more details, please refer to the PDF document or feel free to contact us.

  • Other measurement, recording and measuring instruments

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Rental of diver-held cathodic protection probes

Rental of diver-held cathodic protection probes

Start measuring immediately with one button!

Active in the investigation of underwater structures such as bridge pillars! Useful for regular inspections of sacrificial anodes that protect the base material. *For more details, please refer to the catalog available for download below under "PDF Download." You can also request a quote through "Contact Us." Feel free to reach out.

  • probe
  • Rental/lease

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Nano probe for SEM-FIB, micro probe for optical microscope

Nano probe for SEM-FIB, micro probe for optical microscope

The self-driving nano-probe robot 'miBot', which is different from conventional manipulators!

This innovative nano-probing system can control up to eight miBot nano-probers and can be offered with various configurations and options. Customization is possible to meet application-specific requirements and installation conditions for the equipment. The compact and lightweight platform for miBot can be adapted to various electron microscopes and can be mounted on sample stages such as SEM or introduced into the sample chamber via a load lock. It also supports high-resolution imaging using semi-in-lens objective lenses, enabling nano-probing tests under high-resolution imaging at low acceleration voltages below 0.5 kV using the new FE-SEM. Additionally, it is possible to tilt the entire nano-probing system using the tilt mechanism of the SEM sample stage. This allows for circuit modification with FIB and nano-probing to be performed in the same environment, resulting in faster and more accurate failure analysis results. *For more details, please refer to the PDF document or feel free to contact us.*

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  • probe

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IN271F 製薬工業のプロセス用FT-NIR透過反射プローブ

IN271F 製薬工業のプロセス用FT-NIR透過反射プローブ

ブルカー社で開発した透過反射プローブによりスラリーやエマルジョンの測定が可能で、発酵/培養プロセスのモニタリングが可能です。

ブルカー社で開発した透過反射プローブによりスラリー、エマルジョン、乳製品、クリームの測定や、発酵槽中の反応モニタリングが可能です。お客様のご指定の各種フランジを溶接してご提供可能です。高温タイプもご提供可能です。

  • Other inspection equipment and devices

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Verification of power integrity for DDR memory

Verification of power integrity for DDR memory

Perform low-noise measurements and provide an offset function that zooms in on the DC voltage.

Accurate ripple and noise measurements of power rails require a wideband oscilloscope and dedicated probes, providing an offset function to perform low-noise measurements and zoom in on DC voltage. The R&S RT-ZPR20 power rail probe, R&S RTE, and R&S RTO digital oscilloscopes are suitable tools for this measurement. [Challenges] ■ Direct impact on data transfer performance - Stability of the power distribution network reduces to just 60 mV (Vpp) for DDR4 memory - May decrease further in the future - Ripple and noise adversely affect clock and data jitter *For more details, please refer to the PDF document or feel free to contact us.*

  • Other measurement, recording and measuring instruments
  • oscilloscope
  • probe

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Spring Test Probe

Spring Test Probe

Standard products have a minimum pitch of 0.15 mm and a minimum product length of 1 mm. We also accommodate requests for sizes and shapes other than standard products!

We have prepared spring test probes, backed by the precision machining technology that we have cultivated since our founding and the analytical capabilities accumulated through research and development, as standard products for each pitch size to meet our customers' needs. *We also accept requests for products other than standard items. 【Features】 ■ Long lifespan: 1 million cycles durability → stable resistance value ■ High load: 35gf @ 0.5mm (0.4mm pitch) ■ Low resistance: from 50mΩ ■ Other varieties: minimum diameter of 0.08mm, shortest length of 1.0mm ■ Various surface treatments *For more details, please refer to the PDF document or feel free to contact us.

  • probe

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RF probe and calibration board [Wide frequency range, pitch, excellent durability!]

RF probe and calibration board [Wide frequency range, pitch, excellent durability!]

An RF probe and calibration board with a wide frequency range, pitch, and excellent durability!

Our company offers RF probes and calibration substrates with a wide frequency range, pitch, excellent durability, all at a low price. Thanks to our unique tip shape, stable contact can be achieved with minimal skating during contact, reducing damage to devices and ensuring high reproducibility. The calibration assist software already has product data for the "Allstron TITAN Probe Series" registered, allowing you to use it immediately by simply selecting a probe. 【Product List】 ■Allstron RF Probe "TITAN" ■Allstron RF Probe "TITAN-RC" ■RF Calibration Substrates "AC" ■Calibration software "QAlibria" *For more details, please request materials or view the PDF data available for download.

  • probe

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SK Probe "Attacker AT-001" (Inspection Jig)

SK Probe "Attacker AT-001" (Inspection Jig)

Easy to use anywhere, lightweight, and doesn't cause fatigue - a handy type.

■Features ● Handheld connector terminal insertion failure inspection tool ● Excellent portability with a user-friendly compact design ● Highly reliable design that quickly identifies good and defective products using LED and buzzer ● Simple operation by just pressing the plunger of the attacher against the connector terminal ● Easy replacement of probe pins to match the shape of the connector terminals ■Diagnostic Items ● Terminal disconnection ● Terminal misalignment ● Terminal absence ■Standard Products (Cartridge) Includes one each of S-302-20, S-303-20, and S-305-10. *For other shapes and spring pressures, please choose the 30 series with switch-equipped probes.

  • Circuit Board Inspection Equipment
  • Other inspection equipment and devices

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