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Active in the investigation of underwater structures such as bridge pillars! Useful for regular inspections of sacrificial anodes that protect the base material. *For more details, please refer to the catalog available for download below under "PDF Download." You can also request a quote through "Contact Us." Feel free to reach out.
The self-driving nano-probe robot 'miBot', which is different from conventional manipulators!
This innovative nano-probing system can control up to eight miBot nano-probers and can be offered with various configurations and options. Customization is possible to meet application-specific requirements and installation conditions for the equipment. The compact and lightweight platform for miBot can be adapted to various electron microscopes and can be mounted on sample stages such as SEM or introduced into the sample chamber via a load lock. It also supports high-resolution imaging using semi-in-lens objective lenses, enabling nano-probing tests under high-resolution imaging at low acceleration voltages below 0.5 kV using the new FE-SEM. Additionally, it is possible to tilt the entire nano-probing system using the tilt mechanism of the SEM sample stage. This allows for circuit modification with FIB and nano-probing to be performed in the same environment, resulting in faster and more accurate failure analysis results. *For more details, please refer to the PDF document or feel free to contact us.*
ブルカー社で開発した透過反射プローブによりスラリーやエマルジョンの測定が可能で、発酵/培養プロセスのモニタリングが可能です。
ブルカー社で開発した透過反射プローブによりスラリー、エマルジョン、乳製品、クリームの測定や、発酵槽中の反応モニタリングが可能です。お客様のご指定の各種フランジを溶接してご提供可能です。高温タイプもご提供可能です。
Perform low-noise measurements and provide an offset function that zooms in on the DC voltage.
Accurate ripple and noise measurements of power rails require a wideband oscilloscope and dedicated probes, providing an offset function to perform low-noise measurements and zoom in on DC voltage. The R&S RT-ZPR20 power rail probe, R&S RTE, and R&S RTO digital oscilloscopes are suitable tools for this measurement. [Challenges] ■ Direct impact on data transfer performance - Stability of the power distribution network reduces to just 60 mV (Vpp) for DDR4 memory - May decrease further in the future - Ripple and noise adversely affect clock and data jitter *For more details, please refer to the PDF document or feel free to contact us.*
Standard products have a minimum pitch of 0.15 mm and a minimum product length of 1 mm. We also accommodate requests for sizes and shapes other than standard products!
We have prepared spring test probes, backed by the precision machining technology that we have cultivated since our founding and the analytical capabilities accumulated through research and development, as standard products for each pitch size to meet our customers' needs. *We also accept requests for products other than standard items. 【Features】 ■ Long lifespan: 1 million cycles durability → stable resistance value ■ High load: 35gf @ 0.5mm (0.4mm pitch) ■ Low resistance: from 50mΩ ■ Other varieties: minimum diameter of 0.08mm, shortest length of 1.0mm ■ Various surface treatments *For more details, please refer to the PDF document or feel free to contact us.
![RF probe and calibration board [Wide frequency range, pitch, excellent durability!]](https://image.mono.ipros.com/public/product/image/8e8/2000345762/IPROS2066429142905764199.png?w=280&h=280)
An RF probe and calibration board with a wide frequency range, pitch, and excellent durability!
Our company offers RF probes and calibration substrates with a wide frequency range, pitch, excellent durability, all at a low price. Thanks to our unique tip shape, stable contact can be achieved with minimal skating during contact, reducing damage to devices and ensuring high reproducibility. The calibration assist software already has product data for the "Allstron TITAN Probe Series" registered, allowing you to use it immediately by simply selecting a probe. 【Product List】 ■Allstron RF Probe "TITAN" ■Allstron RF Probe "TITAN-RC" ■RF Calibration Substrates "AC" ■Calibration software "QAlibria" *For more details, please request materials or view the PDF data available for download.
Easy to use anywhere, lightweight, and doesn't cause fatigue - a handy type.
■Features ● Handheld connector terminal insertion failure inspection tool ● Excellent portability with a user-friendly compact design ● Highly reliable design that quickly identifies good and defective products using LED and buzzer ● Simple operation by just pressing the plunger of the attacher against the connector terminal ● Easy replacement of probe pins to match the shape of the connector terminals ■Diagnostic Items ● Terminal disconnection ● Terminal misalignment ● Terminal absence ■Standard Products (Cartridge) Includes one each of S-302-20, S-303-20, and S-305-10. *For other shapes and spring pressures, please choose the 30 series with switch-equipped probes.
Easy to use with a thin and soft material! Current probe for power electronics development.
High-frequency 50MHz compatible! Rogowski coil type current probe The 【CWT Mini50HF】 is a Rogowski coil type current probe compatible with high frequency 50MHz (-3dB), manufactured by PEM (Power Electronic Measurements). The tip is detachable and made of a soft material that is thin and easily bendable, making it user-friendly and capable of accurately reproducing fast current waveforms, including sine waves, quasi-sine waves, and pulse waveforms. It is suitable for the development and analysis of power converters. 【Features】 ■ Detachable tip ■ Usable with digital voltmeters and power recorders *For more details, please refer to the catalog. Feel free to contact us with any inquiries.
AC current probe with frequency characteristics supporting up to 50MHz.
The "CWT Mini50HF" is a Rogowski coil-type current probe with a frequency response of 50MHz (-3dB). Its tip is detachable, making it easy to wrap around conductors, and it is made of a soft, thin, and easily bendable material, making it very user-friendly. Just because it is easy to use does not mean it has poor performance; it can accurately monitor fast current waveforms, sine waves, quasi-sine waves, and pulse waveforms. It is battery-operated for easy handling, but it can also be powered by an AC adapter. Please feel free to contact us.
Common mode noise measurable current probe
Variable speed drives used for controlling AC motors can generate significant high-frequency PWM (Pulse Width Modulation) voltage on the machine's shaft, which may lead to arc currents flowing through the shaft. This current can potentially result in early failure of the motor drive, leading to overheating and melting. The common mode current that occurs in such motors and shafts can be measured using a new current probe called 'CMC.' CMC can also be used for various other applications.
Low-frequency specialized current probe
This is a current probe specialized for low frequencies, with less droop compared to other CWT series. The tip is detachable and made of a thin, flexible material that can be easily bent, making it user-friendly and capable of accurately reproducing fast current waveforms, sine waves, quasi-sine waves, and pulse waveforms. It is battery-operated for easy handling, but can also be powered by an AC adapter. Please feel free to contact us.
"Inspection probes compatible with ultra-fine pitch" Automatic production system from microfabrication to inspection.
The "MEMS Probe" is an ideal MEMS probe for semiconductor wafer testing, including microprocessors and application processors. This product achieves low resistance and low inductance through its unique structure. Additionally, our company manufactures probes with high precision and stable quality, handling everything from the processing of fine MEMS spring probes to inspection, so please feel free to contact us. 【Features】 ■ Unique structure ■ Optimal for semiconductor wafer testing ■ Supports ultra-fine pitch ■ Achieves low resistance and low inductance *For more details, please refer to the catalog or feel free to contact us.
World-class technology and achievements for catheters and semiconductor testing equipment.
Currently, the demand for small springs is rapidly increasing. There are various applications, including contact springs, connector springs, and coil springs used in medical catheters, among others. Among these, the springs used in semiconductor testing equipment are particularly in demand in the microscopic world. They serve the purpose of checking whether current is flowing through the electronic circuits of semiconductors. These are ultra-fine springs with an outer diameter of less than Ф100μm, and there are only a limited number of companies in Japan that can produce them.
Leave the processing and manufacturing of springs to us!
Matsumoto Spring Co., Ltd. manufactures coil and torsion springs, as well as wire processing. We are equipped with facilities such as coiling machines and forming machines. For more details, please download our catalog.
